Detail of Q/0500SGC 003.1-2020

Introduction of Q/0500SGC 003.1-2020

Q/0500SGC 003.1-2020 Test method for complex permittivity of materials at millimeter wave requency Part 1: Test method for complex permittivity of 20-70GHz at room temperature Test method for complex permittivity of materials at millimeter wave frequency - Part 1: Test method for complex permittivity of 20-70 GHz at room temperature 1 Scope This part specifies the measurement methods for inorganic materials, composite plates and engineering plastics with frequency f in the range of 20-70 GHz, permittivity ε’ in the range of 1.05-30 and dielectric dissipation factor tanδ in the range of 0.05-0.0001. This part is applicable to measuring the permittivity ε' and dielectric dissipation factor tanδ of inorganic materials such as alumina, aluminum nitride, silicon oxide, silicon nitride, silicon carbide, zirconia, boron nitride, barium titanate and various types of microwave dielectric materials, organic materials used in printed-circuit boards, such as PTFE, PS, PC, PP, PEEK, PPS, PE, PI and LCP, organic engineering plastics and organic-inorganic composite plates mainly composed of these plastics, as well as to measuring the permittivity ε' and dielectric dissipation factor tanδ of other similar inorganic materials, composite plates and engineering plastics materials. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition (including any amendments) applies. Q/0500SGC 001-2019 Test method for complex permittivity of materials at millimeter wave frequency - Part 1: Open hemispherical electromagnetic wave resonator method 3 Terms and definitions For the purposes of this document, the following terms and definitions apply.   3.1 Fabry-Pérot cavity resonant cavity consisting of two metal plates with highly smooth surfaces that may mutually reflect electromagnetic signals, characterized in that the frequency of incident light satisfies the resonance condition, and the derived transmission spectrum may reach extremely high peak, and the two mutual relations correspond to a very high transmittance; the name of the Fabry-Pérot cavity is a combination of the names of French physicists Charles Fabry and Alfred Pérot 3.2 perturbation method approximate method for solving the electromagnetic eigenvalues of a system with a slight change relative to an initial system, which requires that the volume ratio of the sample in the resonant cavity is less than 1/1000 and the thickness of the test sample is less than 0.1 mm in order to meet the definition of the perturbation method 3.3 advanced Fabry-Pérot perturbation methods; AFPPM Fabry-Pérot perturbation methods improved according to the electromagnetic theory, which have an extended test thickness range of samples and can apply in more substrate materials with standard size in the market, as the traditional Fabry-Pérot perturbation methods are limited in the test thickness of samples, and cannot meet the test requirement for the common thickness of samples in the market

Contents of Q/0500SGC 003.1-2020

Foreword i 1 Scope 2 Normative references 3 Terms and definitions 4 Principle of measurement 5 Test conditions 6 Samples 7 Instruments and apparatus 8 Test method 9 Reports Annex A (Normative) Original test records