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| Position: Chinese Standard in English/QJ 3044-1998 |
| QJ 3044-1998 Semiconductor Integrated Circuit - Test Method for Digital-to-analog Conventer and Digital-to-analog Converter (English Version) | |||
| Standard No.: | QJ 3044-1998 | Status: | valid remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 13000 words | Translation Price(USD): | 390.0 remind me the price change |
| Implemented on: | 1998-8-1 | Delivery: | via email in 1~5 business day |
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| Standard No.: | QJ 3044-1998 |
| English Name: | Semiconductor Integrated Circuit - Test Method for Digital-to-analog Conventer and Digital-to-analog Converter |
| Chinese Name: | 半导体集成电路数/模转换器和模/数转换器测试方法 |
| Chinese Classification: | V2 |
| Professional Classification: | QJ Professional Standard - Aerospace |
| Issued on: | 1998-02-06 |
| Implemented on: | 1998-8-1 |
| Status: | valid |
| Superseding: | QJ 1525-1988 |
| Target Language: | English |
| File Format: | |
| Word Count: | 13000 words |
| Translation Price(USD): | 390.0 |
| Delivery: | via email in 1~5 business day |