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| Position: Chinese Standard in English/SJ 20233-1993 |
| SJ 20233-1993 Verification regulation of model IMPACT-II semiconductor discrete device test sysytem (English Version) | |||
| Standard No.: | SJ 20233-1993 | Status: | valid remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 13000 words | Translation Price(USD): | 390.0 remind me the price change |
| Implemented on: | 1993-5-1 | Delivery: | via email in 1~5 business day |
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| Standard No.: | SJ 20233-1993 |
| English Name: | Verification regulation of model IMPACT-II semiconductor discrete device test sysytem |
| Chinese Name: | IMPACT-Ⅱ型半导体分立器件测试系统检定规程 |
| Chinese Classification: | L0150 |
| Professional Classification: | SJ Professional Standard - Electronics |
| Issued on: | 1993-02-09 |
| Implemented on: | 1993-5-1 |
| Status: | valid |
| Target Language: | English |
| File Format: | |
| Word Count: | 13000 words |
| Translation Price(USD): | 390.0 |
| Delivery: | via email in 1~5 business day |