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| Position: Chinese Standard in English/SJ 2757-1987 |
| SJ 2757-1987 Method of measurement by infra-red reflection for charge carrier concentraiton of heavily doped semiconductors (English Version) | |||
| Standard No.: | SJ 2757-1987 | Status: | valid remind me the status change |
| Language: | English | File Format: | |
| Word Count: | 3000 words | Price(USD): | 90.00 remind me the price change |
| Implemented on: | 1987-7-1 | Delivery: | via email in 1~3 business day |
| Standard No.: | SJ 2757-1987 |
| English Name: | Method of measurement by infra-red reflection for charge carrier concentraiton of heavily doped semiconductors |
| Chinese Name: | 重掺半导体载流子浓度的红外反射测试方法 |
| Chinese Classification: | A01 Technical Management |
| Professional Classification: | SJ Professional Standard - Electronics |
| Issued by: | MIIT |
| Issued on: | 1987-02-10 |
| Implemented on: | 1987-7-1 |
| Status: | valid |
| Language: | English |
| File Format: | |
| Word Count: | 3000 words |
| Price(USD): | 90.00 |
| Delivery: | via email in 1~3 business day |