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Position: Chinese Standard in English/SJ 2798-1987
SJ 2798-1987   Method for determination of particles in electronic grade gases--Light scattering method (English Version)
Standard No.: SJ 2798-1987 Status:abolished remind me the status change

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Target Language:English File Format:PDF
Word Count: 4500 words Translation Price(USD):260.0 remind me the price change

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Implemented on:1988-1-1 Delivery: via email in 1~3 business day

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2010-01-20 ,,1988-1-1,10DAFB26DB2701241513905376784
Standard No.: SJ 2798-1987
English Name: Method for determination of particles in electronic grade gases--Light scattering method
Chinese Name: 电子级气体中颗粒的测定方法 光散射法
Chinese Classification: A01    Technical Management
Professional Classification: SJ    Professional Standard - Electronics
Source Content Issued by: Ministry of Electronics Industry
Issued on: 1987-04-06
Implemented on: 1988-1-1
Status: abolished
Abolished on:2010-01-20
Target Language: English
File Format: PDF
Word Count: 4500 words
Translation Price(USD): 260.0
Delivery: via email in 1~3 business day
本方法适用于电子级氢、氮、氧、氩、氦中颗粒测定,也适用于普通氢、氮、氧、氩、氦及其他无腐蚀性气体中颗粒的测定。
Code of China
Standard
SJ 2798-1987  Method for determination of particles in electronic grade gases--Light scattering method (English Version)
Standard No.SJ 2798-1987
Statusabolished
LanguageEnglish
File FormatPDF
Word Count4500 words
Price(USD)260.0
Implemented on1988-1-1
Deliveryvia email in 1~3 business day
Detail of SJ 2798-1987
Standard No.
SJ 2798-1987
English Name
Method for determination of particles in electronic grade gases--Light scattering method
Chinese Name
电子级气体中颗粒的测定方法 光散射法
Chinese Classification
A01
Professional Classification
SJ
ICS Classification
Issued by
Ministry of Electronics Industry
Issued on
1987-04-06
Implemented on
1988-1-1
Status
abolished
Superseded by
Superseded on
Abolished on
2010-01-20
Superseding
Language
English
File Format
PDF
Word Count
4500 words
Price(USD)
260.0
Keywords
SJ 2798-1987, SJ/T 2798-1987, SJT 2798-1987, SJ2798-1987, SJ 2798, SJ2798, SJ/T2798-1987, SJ/T 2798, SJ/T2798, SJT2798-1987, SJT 2798, SJT2798
Introduction of SJ 2798-1987
本方法适用于电子级氢、氮、氧、氩、氦中颗粒测定,也适用于普通氢、氮、氧、氩、氦及其他无腐蚀性气体中颗粒的测定。
Contents of SJ 2798-1987
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Keywords:
SJ 2798-1987, SJ/T 2798-1987, SJT 2798-1987, SJ2798-1987, SJ 2798, SJ2798, SJ/T2798-1987, SJ/T 2798, SJ/T2798, SJT2798-1987, SJT 2798, SJT2798