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| Position: Chinese Standard in English/SJ 3196-1989 |
| SJ 3196-1989 Test methods for transmitting coefficient of secondary electron of electronic materials (English Version) | |||
| Standard No.: | SJ 3196-1989 | Status: | abolished remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 12500 words | Translation Price(USD): | 204.0 remind me the price change |
| Implemented on: | 1989-3-1 | Delivery: | via email in 1~3 business day |
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| Standard No.: | SJ 3196-1989 |
| English Name: | Test methods for transmitting coefficient of secondary electron of electronic materials |
| Chinese Name: | 电子材料次级电子发射系数的测试方法 |
| Chinese Classification: | A01 Technical Management |
| Professional Classification: | SJ Professional Standard - Electronics |
| Source Content Issued by: | MIIT |
| Issued on: | 1989-2-10 |
| Implemented on: | 1989-3-1 |
| Status: | abolished |
| Abolished on: | 2024-07-11 |
| Superseding: | 公告：中华人民共和国工业和信息化部公告 2024年第17号 |
| Target Language: | English |
| File Format: | |
| Word Count: | 12500 words |
| Translation Price(USD): | 204.0 |
| Delivery: | via email in 1~3 business day |