 |
Chinese Classification
Professional Classification
ICS Classification
Latest
News
Value-added Services
|
| Position: Chinese Standard in English/SJ/T 10481-1994 |
| SJ/T 10481-1994 Test method for resistivity of silicon epitaxial layers by area contacts three-probe techniques (English Version) | |||
| Standard No.: | SJ/T 10481-1994 | Status: | abolished remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 4000 words | Translation Price(USD): | 300.0 remind me the price change |
| Implemented on: | 1994-10-1 | Delivery: | via email in 1~3 business day |
| → | → | → |
| Standard No.: | SJ/T 10481-1994 |
| English Name: | Test method for resistivity of silicon epitaxial layers by area contacts three-probe techniques |
| Chinese Name: | 硅外延层电阻率的面接触三探针测试方法 |
| Chinese Classification: | F01 Technical management |
| Professional Classification: | SJ Professional Standard - Electronics |
| Issued on: | 1994-04-11 |
| Implemented on: | 1994-10-1 |
| Status: | abolished |
| Abolished on: | 2010-01-20 |
| Target Language: | English |
| File Format: | |
| Word Count: | 4000 words |
| Translation Price(USD): | 300.0 |
| Delivery: | via email in 1~3 business day |