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| Position: Chinese Standard in English/SJ/T 10740-1996 |
| SJ/T 10740-1996 Semiconductor integrated circuits - General principles of measuring methods for bipolar random access memories (English Version) | |||
| Standard No.: | SJ/T 10740-1996 | Status: | valid remind me the status change |
| Language: | English | File Format: | |
| Word Count: | 16500 words | Price(USD): | 1344.0 remind me the price change |
| Implemented on: | Delivery: | via email in 1~5 business day | |
| Standard No.: | SJ/T 10740-1996 |
| English Name: | Semiconductor integrated circuits - General principles of measuring methods for bipolar random access memories |
| Professional Classification: | SJ Professional Standard - Electronics |
| Status: | valid |
| Superseding: | GB 3444-1982 General principles of measuring methods of bipolar random access memory for semiconductor integrated circuits |
| Language: | English |
| File Format: | |
| Word Count: | 16500 words |
| Price(USD): | 1344.0 |
| Delivery: | via email in 1~5 business day |