SJ/T 10745-1996 English Version, SJ/T 10745-1996 Mechanical and climatic test methods for semiconductor integrated circuits (English Version)

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SJ/T 10745-1996 Mechanical and climatic test methods for semiconductor integrated circuits (English Version)
Standard No.:	SJ/T 10745-1996	Status:	valid remind me the status change Email:
Language:	English	File Format:	PDF
Word Count:	21000 words	Price(USD):	1210.0 remind me the price change Email:
Implemented on:		Delivery:	via email in 1~8 business day

Standard No.:	SJ/T 10745-1996
English Name:	Mechanical and climatic test methods for semiconductor integrated circuits
Professional Classification:	SJ Professional Standard - Electronics
Status:	valid
Superseding:	GB 4590-1984 Mechanical and climatic test methods for semiconductor integrated circuits
Language:	English
File Format:	PDF
Word Count:	21000 words
Price(USD):	1210.0
Delivery:	via email in 1~8 business day

Standard

SJ/T 10745-1996 Mechanical and climatic test methods for semiconductor integrated circuits (English Version)
Standard No.	SJ/T 10745-1996
Status	valid
Language	English
File Format	PDF
Word Count	21000 words
Price(USD)	1210.0
Implemented on
Delivery	via email in 1~8 business day

Detail of SJ/T 10745-1996

Standard No.

English Name

Chinese Name

Chinese Classification

Professional Classification

ICS Classification

Issued by

Issued on

Implemented on

Status

Superseded by

Superseded on

Abolished on

Superseding

Language

File Format

Word Count

Price(USD)

Keywords

Introduction of SJ/T 10745-1996

Contents of SJ/T 10745-1996

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