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Position: Chinese Standard in English/T/CIE 152-2022 |
T/CIE 152-2022 Test method and procedure for identification of physical characteristics of fake and counterfeit microelectronics devices (English Version) | |||
Standard No.: | T/CIE 152-2022 | Status: | valid remind me the status change |
Language: | English | File Format: | |
Word Count: | 8500 words | Price(USD): | 255.00 remind me the price change |
Implemented on: | Delivery: | via email in 1~3 business day | |
Standard No.: | T/CIE 152-2022 |
English Name: | Test method and procedure for identification of physical characteristics of fake and counterfeit microelectronics devices |
Chinese Name: | 微电子器件假冒翻新物理特征识别方法与程序 |
Chinese Classification: | L74 Program language |
Professional Classification: | T/ Social Organization Standard |
Issued by: | CIE |
Issued on: | 2022-12-31 |
Status: | valid |
Language: | English |
File Format: | |
Word Count: | 8500 words |
Price(USD): | 255.00 |
Delivery: | via email in 1~3 business day |
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Keywords: | ||
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