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| T/CIE 155-2023 Measuring methods of electrical properties for non-volatile phase change memory (English Version) |
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Detail of T/CIE 155-2023
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Introduction of T/CIE 155-2023
本文件规定了相变存储器件单元的电性能测试方法，分为器件性能测试和器件可靠性测试，器件性能测试包括电流-电压特性、存储窗口、置位时间、置位电压、复位时间、复位电压、功耗；器件可靠性测试包括耐久和数据保持时间。
本文件适用于相变存储器件单元。
Contents of T/CIE 155-2023