Standard No.:	T/CSA 100-2025
Chinese Name:	Micro-LED芯片光电性能测试方法
Professional Classification:	T/    Social Organization Standard
ICS Classification:	31.080.01 31.080.01    Semiconductor devices in general 31.080.01
Source Content Issued by:	China Solid Statelighting Alliance
Issued on:	2025-09-28
Implemented on:	2025-9-28
Status:	valid
Target Language:	English
File Format:	PDF

T/CSA100-2025《Micro-LED芯片光电性能测试方法》描述了单色Micro-LED芯片的光电性能测试方法。文件适用于发光台面(mesa)的长边边长（或直径）在1μm～50μm范围内的单色Micro-LED芯片的光电性能测试评估。