Standard No.:	T/SLEIA 0003-2024
Chinese Name:	光电耦合器可靠性评价方法
Professional Classification:	T/    Social Organization Standard
ICS Classification:	31.080.01 31.080.01    Semiconductor devices in general 31.080.01
Source Content Issued by:	SLEIA
Issued on:	2024-01-26
Implemented on:	2024-2-26
Status:	valid
Target Language:	English
File Format:	PDF

本文件规定了用于光电耦合器件（以下简称器件）可靠性评价的低频噪声参数、评价方法及方法应用。