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| Position: Chinese Standard in English/YS/T 23-2016 |
| YS/T 23-2016 Test method for thickness of epitaxial layers-Stacking fault size (English Version) | |||
| Standard No.: | YS/T 23-2016 | Status: | valid remind me the status change |
| Language: | English | File Format: | |
| Word Count: | 4000 words | Price(USD): | 120.00 remind me the price change |
| Implemented on: | 2016-9-1 | Delivery: | via email in 1~3 business day |
| Standard No.: | YS/T 23-2016 |
| English Name: | Test method for thickness of epitaxial layers-Stacking fault size |
| Chinese Name: | 硅外延层厚度测定 堆垛层错尺寸法 |
| Professional Classification: | YS Professional Standard - Non-ferrous Metal |
| Issued by: | Ministry of Industry and Information Technology |
| Issued on: | 2016-04-05 |
| Implemented on: | 2016-9-1 |
| Status: | valid |
| Superseding: | YS/T 23-1992 Thickness determination for silicon epitaxial layers - Stacking fault method |
| Language: | English |
| File Format: | |
| Word Count: | 4000 words |
| Price(USD): | 120.00 |
| Delivery: | via email in 1~3 business day |