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| Chinese National Standard Category: Metal physical property test method |
| English Title: | Test method for resistivity of silicon and germanium bars using a two-point probe |
| Chinese Title: | 硅、锗单晶电阻率测定直流两探针法 |
| Standard No.: | GB/T 1551-1995 |
| Category No.: | H21 |
| Issued by: | SBTS |
| Issued on: | 1995-04-18 |
| Implemented on: | 1995-1-2 |
| Status: | superseded |
| Superseded by: | GB/T 1551-2009 Test method for measuring resistivity of monocrystal silicon |
| Superseded on: | 2010-6-1 |
| Abolished on: | |
| Superseding: | GB 1551-1979 Test method for resistivity of silicon bars using a two-point probe GB 5253-1985 Test method for resistivity of germanium bars using a two-point probe |
| Word Count: | 6000 words |
| Similar Standards: | GB/T 6618-1995 GB/T 8364-2003 GB/T 6522-1986 GB/T 4108-2004 GB/T 6608-1999 GB 1552-1979 GB/T 21115-2007 GB/T 4107-2004 GB 5251-1985 GB/T 3248-1982 GB/T 43315-2023 GB/T 43313-2023 GB/T 43096-2023 GB/T 43092-2023 GB/T 23365-2023 GB/T 43093-2023 GB/T 42902-2023 GB/T 1555-2023 GB/T 42676-2023 GB/T 42905-2023 |
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