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| Position: Chinese Standard in English/GB 1556-1979 |
| GB 1556-1979 Determination method for the the orientation of X-ray diffraction of silicon single crystal (English Version) | |||
| Standard No.: | GB 1556-1979 | Status: | superseded |
| Language: | English | File Format: | |
| Word Count: | 1000 words | Price(USD): | 30.00 remind me the price change |
| Implemented on: | 1980-1-1 | Delivery: | via email in 1~3 business day |
| Standard No.: | GB 1556-1979 |
| English Name: | Determination method for the the orientation of X-ray diffraction of silicon single crystal |
| Chinese Name: | 硅单晶晶向X光衍射测量方法 |
| Chinese Classification: | H21 Metal physical property test method |
| Professional Classification: | GB National Standard |
| Implemented on: | 1980-1-1 |
| Status: | superseded |
| Superseded by: | GB/T 1555-1997 Test methods for determining the orientation of a semiconductor single crystal |
| Superseded on: | 1998-8-1 |
| Language: | English |
| File Format: | |
| Word Count: | 1000 words |
| Price(USD): | 30.00 |
| Delivery: | via email in 1~3 business day |