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| Position: Chinese Standard in English/GB/T 1555-1997 |
| GB/T 1555-1997 Test methods for determining the orientation of a semiconductor single crystal (English Version) | |||
| Standard No.: | GB/T 1555-1997 | Status: | superseded |
| Language: | English | File Format: | |
| Word Count: | 3500 words | Price(USD): | 300.00 remind me the price change |
| Implemented on: | 1998-8-1 | Delivery: | via email in 1~3 business day |
| Standard No.: | GB/T 1555-1997 |
| English Name: | Test methods for determining the orientation of a semiconductor single crystal |
| Chinese Name: | 半导体单晶晶向测定方法 |
| Chinese Classification: | H21 Metal physical property test method |
| Professional Classification: | GB National Standard |
| ICS Classification: | 29.045 Semiconducting materials |
| Issued by: | SBTS |
| Issued on: | 1997-01-02 |
| Implemented on: | 1998-8-1 |
| Status: | superseded |
| Superseded by: | GB/T 1555-2009 Testing methods for determining the orientation of a semiconductor single crystal |
| Superseded on: | 2010-6-1 |
| Superseding: | GB 1555-1979 GB 1556-1979 GB 5254-1985 GB 5255-1985 GB 8759-1988 GB/T 8759-1988 Compound semiconductive single crystals--Determination of crzystallographic orientation--X-ray diffraction method |
| Language: | English |
| File Format: | |
| Word Count: | 3500 words |
| Price(USD): | 300.00 |
| Delivery: | via email in 1~3 business day |