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| Position: Chinese Standard in English/GB 4937-1985 |
| GB 4937-1985 Mechanical and climatic test methods for discrete semiconductor devices (English Version) | |||
| Standard No.: | GB 4937-1985 | Status: | superseded remind me the status change |
| Language: | English | File Format: | |
| Word Count: | 9500 words | Price(USD): | 280.0 remind me the price change |
| Implemented on: | 1985-11-1 | Delivery: | via email in 1~3 business day |
| Standard No.: | GB 4937-1985 |
| English Name: | Mechanical and climatic test methods for discrete semiconductor devices |
| Chinese Name: | 半导体分立器件机械和气候试验方法 |
| Chinese Classification: | L40 Semiconductor discrete devices in general |
| Professional Classification: | GB National Standard |
| Implemented on: | 1985-11-1 |
| Status: | superseded |
| Superseded by: | GB/T 4937-1995 Mechanical and climatic test methods for semiconductor devices |
| Superseded on: | 1996-8-1 |
| Language: | English |
| File Format: | |
| Word Count: | 9500 words |
| Price(USD): | 280.0 |
| Delivery: | via email in 1~3 business day |