Standard No.:	GB/T 4937-1995
English Name:	Mechanical and climatic test methods for semiconductor devices
Chinese Name:	半导体器件机械和气候试验方法
Chinese Classification:	L40    Semiconductor discrete devices in general
Professional Classification:	GB    National Standard
Source Content Issued by:	STSB
Issued on:	1995-01-02
Implemented on:	1996-8-1
Status:	superseded
Superseded by:	GB/T 4937.2-2006 Semiconductor devices - Mechanical and climatic test methods - Part 2 : Low air pressure GB/T 4937.1-2006 Semiconductor devices - Mechanical and climatic test methods - Part 1 : General
Superseded on:	2007-2-1
Superseding:	GB 4937-1986 GB/T 4937.2-2006 Semiconductor devices - Mechanical and climatic test methods - Part 2 : Low air pressure GB 4937-1985 Mechanical and climatic test methods for discrete semiconductor devices
Target Language:	English
File Format:	PDF
Word Count:	16000 words
Translation Price(USD):	480.0
Delivery:	via email in 1~5 business day

本标准列出了适用于半导体器件(分立器件和集成电路)的试验方法。使用时可从中进行选择。对于非空腔器件，可以要求补充的试验方法。