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| Position: Chinese Standard in English/GB/T 4937-1995 |
| GB/T 4937-1995 Mechanical and climatic test methods for semiconductor devices (English Version) | |||
| Standard No.: | GB/T 4937-1995 | Status: | superseded remind me the status change |
| Language: | English | File Format: | |
| Word Count: | 16000 words | Price(USD): | 480.0 remind me the price change |
| Implemented on: | 1996-8-1 | Delivery: | via email in 1~5 business day |
| Standard No.: | GB/T 4937-1995 |
| English Name: | Mechanical and climatic test methods for semiconductor devices |
| Chinese Name: | 半导体器件机械和气候试验方法 |
| Chinese Classification: | L40 Semiconductor discrete devices in general |
| Professional Classification: | GB National Standard |
| Issued by: | STSB |
| Issued on: | 1995-01-02 |
| Implemented on: | 1996-8-1 |
| Status: | superseded |
| Superseded by: | GB/T 4937.2-2006 Semiconductor devices - Mechanical and climatic test methods - Part 2 : Low air pressure GB/T 4937.1-2006 Semiconductor devices - Mechanical and climatic test methods - Part 1 : General |
| Superseded on: | 2007-2-1 |
| Superseding: | GB 4937-1986 GB/T 4937.2-2006 Semiconductor devices - Mechanical and climatic test methods - Part 2 : Low air pressure GB 4937-1985 Mechanical and climatic test methods for discrete semiconductor devices |
| Language: | English |
| File Format: | |
| Word Count: | 16000 words |
| Price(USD): | 480.0 |
| Delivery: | via email in 1~5 business day |