GB/T 1550-1997 English Version, GB/T 1550-1997 methods for measuring conductivity type of extrinsic semiconducting materials (English Version)

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Position: Chinese Standard in English/GB/T 1550-1997

GB/T 1550-1997 methods for measuring conductivity type of extrinsic semiconducting materials (English Version)
Standard No.:	GB/T 1550-1997	Status:	superseded remind me the status change Email:
Language:	English	File Format:	PDF
Word Count:	4000 words	Price(USD):	120.0 remind me the price change Email:
Implemented on:	1997-1-2	Delivery:	via email in 1~3 business day

Standard No.:	GB/T 1550-1997
English Name:	methods for measuring conductivity type of extrinsic semiconducting materials
Chinese Name:	非本征半导体材料导电类型测试方法
Chinese Classification:	H21 Metal physical property test method
Professional Classification:	GB National Standard
ICS Classification:	77.040.01 77.040.01 Testing of metals in general 77.040.01
Issued by:	AQSIQ
Issued on:	1997-6-3
Implemented on:	1997-1-2
Status:	superseded
Superseded by:	GB/T 1550-2018 Test methods for conductivity type of extrinsic semiconducting materials
Superseded on:	2019-11-1
Superseding:	GB 5256-1985 锗单晶导电类型测量方法
Language:	English
File Format:	PDF
Word Count:	4000 words
Price(USD):	120.0
Delivery:	via email in 1~3 business day

GB/T 1550-1997 is referred in:

* GB/T 12963-2009 Specification for Polycrystalline Silicon
* GB/T 12963-2009 Specification for Polycrystalline Silicon

Standard

GB/T 1550-1997 methods for measuring conductivity type of extrinsic semiconducting materials (English Version)
Standard No.	GB/T 1550-1997
Status	superseded
Language	English
File Format	PDF
Word Count	4000 words
Price(USD)	120.0
Implemented on	1997-1-2
Delivery	via email in 1~3 business day

Detail of GB/T 1550-1997

Standard No.

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ICS Classification

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Implemented on

Status

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Keywords

Introduction of GB/T 1550-1997

本标准规定了非本征半导体材料导电类型的测定方法。本标准适用于非本征半导体材料导电类型的测定，其中较详细地规定了锗和硅导电类型的测试方法。本标准方法能保证对均匀的同一导电类型的材料测得的可靠结果，对于非均匀试样，可在其表面上测出不同导电类型区域。本标准方法不适用于分层结构试样，如外延片的导电类型的测定。

Contents of GB/T 1550-1997

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