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Position: Chinese Standard in English/GB/T 24581-2022 |
GB/T 24581-2022 Test method for Ⅲ and Ⅴ impurities content in single crystal silicon—Low temperature FT-IR analysis method (English Version) | |||
Standard No.: | GB/T 24581-2022 | Status: | valid remind me the status change
Email: |
Language: | English | File Format: | |
Word Count: | 5500 words | Price(USD): | 165.0 remind me the price change
Email: |
Implemented on: | 2022-10-1 | Delivery: | via email in 1~3 business day |
Standard No.: | GB/T 24581-2022 |
English Name: | Test method for Ⅲ and Ⅴ impurities content in single crystal silicon—Low temperature FT-IR analysis method |
Chinese Name: | 硅单晶中III、V族杂质含量的测定 低温傅立叶变换红外光谱法 |
Chinese Classification: | H17 Semimetal and semiconductor material analysis method |
Professional Classification: | GB National Standard |
Issued by: | SAMR; SAC |
Issued on: | 2022-03-09 |
Implemented on: | 2022-10-1 |
Status: | valid |
Superseding: | GB/T 24581-2009 Test method for low temperature FT-IR analysis of single crystal silicon for Ⅲ-Ⅴ impurities |
Language: | English |
File Format: | |
Word Count: | 5500 words |
Price(USD): | 165.0 |
Delivery: | via email in 1~3 business day |
GB/T 24581-2022 Test method for Ⅲ and Ⅴ impurities content in single crystal silicon—Low temperature FT-IR analysis method (English Version) | |||
Standard No. | GB/T 24581-2022 | ||
Status | valid | ||
Language | English | ||
File Format | |||
Word Count | 5500 words | ||
Price(USD) | 165.0 | ||
Implemented on | 2022-10-1 | ||
Delivery | via email in 1~3 business day |
Standard No. |
GB/T 24581-2022 |
English Name |
Test method for Ⅲ and Ⅴ impurities content in single crystal silicon—Low temperature FT-IR analysis method |
Chinese Name |
硅单晶中III、V族杂质含量的测定 低温傅立叶变换红外光谱法 |
Chinese Classification |
H17 |
Professional Classification |
GB |
ICS Classification |
Issued by |
SAMR; SAC |
Issued on |
2022-03-09 |
Implemented on |
2022-10-1 |
Status |
valid |
Superseded by |
Superseded on |
Abolished on |
Superseding |
GB/T 24581-2009 Test method for low temperature FT-IR analysis of single crystal silicon for Ⅲ-Ⅴ impurities |
Language |
English |
File Format |
Word Count |
5500 words |
Price(USD) |
165.0 |
Keywords |
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Keywords: | ||
GB/T 24581-2022, GB 24581-2022, GBT 24581-2022, GB/T24581-2022, GB/T 24581, GB/T24581, GB24581-2022, GB 24581, GB24581, GBT24581-2022, GBT 24581, GBT24581 |