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| Position: Chinese Standard in English/GB/T 30867-2014 |
| GB/T 30867-2014 Test method for measuring thickness and total thickness variation of monocrystalline silicon carbide wafers (English Version) | |||
| Standard No.: | GB/T 30867-2014 | Status: | to be superseded remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 3500 words | Translation Price(USD): | 90.0 remind me the price change |
| Implemented on: | 2015-2-1 | Delivery: | via email in 1~3 business day |
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| Standard No.: | GB/T 30867-2014 |
| English Name: | Test method for measuring thickness and total thickness variation of monocrystalline silicon carbide wafers |
| Chinese Name: | 碳化硅单晶片厚度和总厚度变化测试方法 |
| Chinese Classification: | H83 Compound semiconductor material |
| Professional Classification: | GB National Standard |
| ICS Classification: | 29.045 Semiconducting materials |
| Source Content Issued by: | AQSIQ; SAC |
| Issued on: | 2014-07-24 |
| Implemented on: | 2015-2-1 |
| Status: | to be superseded |
| Superseded by: | GB/T 32278-2025 |
| Superseded on: | 2026-2-1 |
| Target Language: | English |
| File Format: | |
| Word Count: | 3500 words |
| Translation Price(USD): | 90.0 |
| Delivery: | via email in 1~3 business day |