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Position: Chinese Standard in English/GB/T 4937.1-2006
GB/T 4937.1-2006   Semiconductor devices - Mechanical and climatic test methods - Part 1 : General (English Version)
Standard No.: GB/T 4937.1-2006 Status:valid remind me the status change

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Target Language:English File Format:PDF
Word Count: 2500 words Translation Price(USD):75.0 remind me the price change

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Implemented on:2007-2-1 Delivery: via email in 1~3 business day

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Standard No.: GB/T 4937.1-2006
English Name: Semiconductor devices - Mechanical and climatic test methods - Part 1 : General
Chinese Name: 半导体器件 机械和气候试验 第1部分:总则
Chinese Classification: L40    Semiconductor discrete devices in general
Professional Classification: GB    National Standard
Source Content Issued by: SAC AQSIQ
Issued on: 2006-8-23
Implemented on: 2007-2-1
Status: valid
Superseding:GB/T 4937-1995 Mechanical and climatic test methods for semiconductor devices
Target Language: English
File Format: PDF
Word Count: 2500 words
Translation Price(USD): 75.0
Delivery: via email in 1~3 business day
本部分代替GB/T 4937-1995《半导体器件 机械和气候试验方法》第Ⅰ篇总则。本部分适用于半导体器件(分立器件和集成电路)并为GB/T 4937系列的其他部分建立通用准则。
GB/T 4937.1-2006 is referred in:
*GB/T 44924-2024 Semiconductor integrated circuits—Measuring methods for RF transmitter/receiver
Code of China
Standard
GB/T 4937.1-2006   Semiconductor devices - Mechanical and climatic test methods - Part 1 : General (English Version)
Standard No.GB/T 4937.1-2006
Statusvalid
LanguageEnglish
File FormatPDF
Word Count2500 words
Price(USD)75.0
Implemented on2007-2-1
Deliveryvia email in 1~3 business day
Detail of GB/T 4937.1-2006
Standard No.
GB/T 4937.1-2006
English Name
Semiconductor devices - Mechanical and climatic test methods - Part 1 : General
Chinese Name
半导体器件 机械和气候试验 第1部分:总则
Chinese Classification
L40
Professional Classification
GB
ICS Classification
Issued by
SAC AQSIQ
Issued on
2006-8-23
Implemented on
2007-2-1
Status
valid
Superseded by
Superseded on
Abolished on
Superseding
GB/T 4937-1995 Mechanical and climatic test methods for semiconductor devices
Language
English
File Format
PDF
Word Count
2500 words
Price(USD)
75.0
Keywords
GB/T 4937.1-2006, GB 4937.1-2006, GBT 4937.1-2006, GB/T4937.1-2006, GB/T 4937.1, GB/T4937.1, GB4937.1-2006, GB 4937.1, GB4937.1, GBT4937.1-2006, GBT 4937.1, GBT4937.1
Introduction of GB/T 4937.1-2006
本部分代替GB/T 4937-1995《半导体器件 机械和气候试验方法》第Ⅰ篇总则。本部分适用于半导体器件(分立器件和集成电路)并为GB/T 4937系列的其他部分建立通用准则。
Contents of GB/T 4937.1-2006
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Keywords:
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