 |
Chinese Classification
Professional Classification
ICS Classification
Latest
News
Value-added Services
|
| Position: Chinese Standard in English/GB/T 6616-2023 |
| GB/T 6616-2023 Test method for resistivity of semiconductor wafers and sheet resistance of semiconductor films—Noncontact eddy-current gauge (English Version) | |||
| Standard No.: | GB/T 6616-2023 | Status: | valid remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 7500 words | Translation Price(USD): | 225.0 remind me the price change |
| Implemented on: | 2024-3-1 | Delivery: | via email in 1~3 business day |
| → | → | → |
| Standard No.: | GB/T 6616-2023 |
| English Name: | Test method for resistivity of semiconductor wafers and sheet resistance of semiconductor films—Noncontact eddy-current gauge |
| Chinese Name: | 半导体晶片电阻率及半导体薄膜薄层电阻的测试 非接触涡流法 |
| Chinese Classification: | H21 Metal physical property test method |
| Professional Classification: | GB National Standard |
| Source Content Issued by: | SAMR; SAC |
| Issued on: | 2023-08-06 |
| Implemented on: | 2024-3-1 |
| Status: | valid |
| Superseding: | GB/T 6616-2009 Test methods for measuring resistivity of semiconductor wafers or sheet resistance of semiconductor films with a noncontact eddy-current gauge |
| Target Language: | English |
| File Format: | |
| Word Count: | 7500 words |
| Translation Price(USD): | 225.0 |
| Delivery: | via email in 1~3 business day |