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| Position: Chinese Standard in English/SJ 2214.6-1982 |
| SJ 2214.6-1982 Method of measurement for collector-emitter reverse breakdown voltage of semiconductor phototransistors (English Version) | |||
| Standard No.: | SJ 2214.6-1982 | Status: | abolished remind me the status change |
| Language: | English | File Format: | |
| Word Count: | 500 words | Price(USD): | 184.0 remind me the price change |
| Implemented on: | 1983-7-1 | Delivery: | via email in 1~3 business day |
| Standard No.: | SJ 2214.6-1982 |
| English Name: | Method of measurement for collector-emitter reverse breakdown voltage of semiconductor phototransistors |
| Chinese Name: | 半导体光敏三极管集电极－发射极反向击穿电压的测试方法 |
| Chinese Classification: | M01 Technical management |
| Professional Classification: | SJ Professional Standard - Electronics |
| Issued by: | MOEI |
| Issued on: | 1982-11-30 |
| Implemented on: | 1983-7-1 |
| Status: | abolished |
| Superseded by: | SJ/T 2214-2015 Measuring methods for semiconductor photodiode and phototransistor |
| Superseded on: | 2015-10-1 |
| Abolished on: | 2015-10-01 |
| Language: | English |
| File Format: | |
| Word Count: | 500 words |
| Price(USD): | 184.0 |
| Delivery: | via email in 1~3 business day |