 |
Chinese Classification
Professional Classification
ICS Classification
Latest
News
Value-added Services
|
LoginRegister |
| Position: Chinese Standard in English/YS/T 26-1992 |
| YS/T 26-1992 Test method for silicon wafer edge (English Version) | |||
| Standard No.: | YS/T 26-1992 | Status: | superseded |
| Language: | English | File Format: | |
| Word Count: | 2000 words | Price(USD): | 60.00 remind me the price change |
| Implemented on: | 1993-1-1 | Delivery: | via email in 1~3 business day |
| Standard No.: | YS/T 26-1992 |
| English Name: | Test method for silicon wafer edge |
| Chinese Name: | 硅片边缘轮郭检验方法 |
| Chinese Classification: | H81 Semimetal |
| Professional Classification: | YS Professional Standard - Non-ferrous Metal |
| ICS Classification: | 29.045 Semiconducting materials |
| Issued by: | China Nonferrous Metals Industry Corporation |
| Issued on: | 1992-3-9 |
| Implemented on: | 1993-1-1 |
| Status: | superseded |
| Superseded by: | YS/T 26-2016 Test methods for edge contour of silicon wafers |
| Superseded on: | 2017-1-1 |
| Language: | English |
| File Format: | |
| Word Count: | 2000 words |
| Price(USD): | 60.00 |
| Delivery: | via email in 1~3 business day |