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Title Standard No. Implemented On
Critical current measurement—DC critical current of Ag-and/or Ag alloy-sheathed Bi-2212 and Bi-2223 oxide superconductorsGB/T 18502-20182018-7-1
Shear testing method of aluminium alloy products for structural membersGB/T 34487-20172018-5-1
Technical regulation of Phased-array Ultrasonic Testing for socket welded joints of small diameter pipeDB37/T 3143-20182018-3-13
Technical regulation of Phased-array Ultrasonic Testing for welded joints of small diameter pipeDB37/T 3142-20182018-3-13
Test methods for aluminium and aluminium alloy foils―Part 2:Determination of pinholeGB/T 22638.2-20162017-11-1
Test methods for aluminium and aluminium alloy foils--Part 6: Determination of direct current resistanceGB/T 22638.6-20162017-11-1
Test methods for aluminium and aluminium alloy foils--Part 5: Determination of wettability by brushingGB/T 22638.5-20162017-11-1
Test methods for aluminium and aluminium alloy foils--Part 3: Determination of stickinessGB/T 22638.3-20162017-11-1
Test methods for aluminium and aluminium alloy foils Part 9: Determination of hydrophilec propertyGB/T 22638.9-20162017-11-1
Test methods for aluminium and aluminium alloy foils―Part 1:Determination of thicknessGB/T 22638.1-20162017-11-1
Test methods for aluminium and aluminium alloy foils―Part 4:Determination of surface wetting tensionGB/T 22638.4-20162017-11-1
Test methods for aluminium and aluminium alloy foils―Part 10:Determination of mass per unit area(surface density) of coatingsGB/T 22638.10-20162017-11-1
Test methods for aluminum and aluminum alloy foils--Part 8: Determination of cube texture contentGB/T 22638.8-20162017-11-1
Optical emission spectrometric analysis method of aluminum and aluminum alloysGB/T 7999-20152016-4-1
Critical temperature measurement―Critical temperature of composite superconductors by a resistance methodGB/T 31780-20152016-2-1
Mechanical properties measurement―Room temperature tensile test of NbTi/Cu composite superconductorsGB/T 31527-20152015-12-1
Superconductivity - Measurements for Bulk High Temperature Superconductors - Trapped Flux Density of Large Grain Oxide SuperconductorsGB/T 30537-20142014-11-1
Experimental method for flux inclusions and oxide in wrought magnesium alloysGB/T 26284-20102011-11-1
Metallographs for high manganese cast steelGB/T 13925-20102011-6-1
Test method for resistivity of precision resistance alloysGB/T 6146-20102011-5-1
Superconductivity:Residual resistance ratio measurement of Nb-Ti composite superconductorsGB/T 25897-20102011-5-1
Test methods for aluminium and aluminium alloy foils - Part 1: Determination of thickness by gravimetric methodGB/T 22638.1-20082009-11-1
Test methods for aluminium and aluminium alloy foils - Part 10: Determination of mass per unit area (surface density) of coatingsGB/T 22638.10-20082009-11-1
Test methods for aluminium and aluminium alloy foils - Part 9: Determination of hydrophilic propertyGB/T 22638.9-20082009-11-1
Test methods for aluminium and aluminium alloy foils - Part 5: Determination of wettability by brushingGB/T 22638.5-20082009-11-1
Test methods for aluminium and aluminium alloy foils - Part 6: Determination of direct current resistanceGB/T 22638.6-20082009-11-1
Test methods for aluminium and aluminium alloy foils - Part 7: Determination of heat seal strengthGB/T 22638.7-20082009-11-1
Test methods for aluminium and aluminium alloy foils - Part 4: Determination of surface wetting tensionGB/T 22638.4-20082009-11-1
Test methods for aluminium and aluminium alloy foils - Part 3: Determination of stickinessGB/T 22638.3-20082009-11-1
Test methods for aluminium and aluminium alloy foils - Part 2: Determination of porosityGB/T 22638.2-20082009-11-1
Critical current measurement - DC critical current of Nb-Ti composite superconductorsGB/T 21546-20082008-11-1
Standard practice for determining the metallographical constituent and inclusion content of steels and other metals by automatic image analysis - Part 3: Determining the carbides rating in steels by automatic image analysis and stereologyGB/T 18876.3-20082008-11-1
Steel wire ropes-Determination of lubricant contentYB/T 4182-20082008-11-1
Chemical analysis methods of high purity aluminum Part 9: Determination of trace impurities in high pruity aluminumby inductively coupled mass spectrometryYS/T 244.9-20082008-9-1
Wrought copper and copper alloys—Detection of residual stress—Ammonia testGB/T 10567.2-20072008-4-1
Polycrystalline silicon—Examination method—Zone-melting on phosphorus under controlled atmosphereGB/T 4059-20072008-2-1
Standard method for measuring radial resistivity variation on silicon slicesGB/T 11073-20072008-2-1
Polycrystalline silicon—Examination method—Vacuum zone-melting on boronGB/T 4060-20072008-2-1
Optical emission spectrometric analysis method of aluminum and aluminum alloysGB/T 7999-20072007-11-1
Standard practice for determining the metallographical constituent and inclusion content of steels and other metals by automatic image analysis - Part 2: Determining the inclusion raGB/T 18876.2-20062007-2-1
Statistics rule for treatment of spectral analysis data YB/T 4142-20062006-12-1
Standard practice for establishing and controlling spectrochemical analytical curvesYB/T 4144-20062006-12-1
Development of standard samples of materials used for inspection of uniformity ofYB/T 4143-20062006-12-1
Germanium monocrystal - inspection of dislocation etch pit density GB/T 5252-20062006-11-1
Extrinsic semiconductor single crystals measurement of Hall mobility and Hall coefficientGB/T 4326-20062006-11-1
Measurement method for magnetic property of small single sheet sample of electrical stripYB/T 4148-20062006-11-1
The gradational standard of spheroidizition for 2.25Cr-1Mo steel used in power plantDL/T 999-20062006-10-1
Determination of iron aluminium calcium magnesium manganese zinc copper titanium chromium nickel vanadium in metal silicon - Inductively coupled plasma atomic emission spectrometrySN/T 1650-20052006-5-1
Standard test methods for measuring site flatness on silicon wafers by noncontact scanningGB/T 19922-20052006-4-1
Test method of particles on silicon wafer surfacesGB/T 19921-20052006-4-1
Test method for temperature-resistance coefficient of precision resistance alloysGB/T 6148-20052006-4-1
Test method for thermoelectric power of precision resistance alloysGB/T 6147-20052006-4-1
method for electrical conductivity measurement of copper and copper alloys by use of eddy currentYS/T 478-20052005-12-1
Measuring method of magnetic properties at alternative current for amorphousand nanocrystalline soft magnetic alloysGB/T 19346-20032004-5-1
Methods of measurement of density,resistivity and stacking factor of electrical steel sheet and stripGB/T 19289-20032004-4-1
STANDARD diagrams for macrostructure and defect of structural steelsGB/T 1979-20012002-5-1
Methods of measurement of the magnetic properties of electrical steel sheet and strip by mesns of an Epstein frameGB/T 3655-20002001-9-1
The test method of thermo-emf for platinum rhodium thermocouple thin wiresGB/T 18036-20002000-9-1
The inspecting method of AB microscopic defect in gallium arsenide single crystalGB/T 18032-20002000-9-1
Testing method for electrical resistance-temperature characteristic parameters of metallic materialsGB/T 4067-19992000-8-1
Testing method for thermal expansion characteristic parameters of metallic materialsGB/T 4339-19992000-8-1
STANDARD method for direct reading spectrometric analysis of aluminum and its alloysGB/T 7999-20002000-1-2
Technical specification of controlling weld hardness of steel equipment to prevent sulfide stress crackingSY/T 0059-19991999-12-1
Test methods of precious metal pastes used for thick film microelectronics--Determination of finenessGB/T 17473.2-19981999-3-1
Test methods of precious metal pastes used for thick film microelectronics--Determination of sheet resistanceGB/T 17473.3-19981999-3-1
Test methods of precious metal pastes used for thick film microelectronics--Test of solderability and solderleaching resistanceGB/T 17473.7-19981999-3-1
Test methods of precious metal pastes used for thick film microelectronics--Determination of adhesionGB/T 17473.4-19981999-3-1
Test methods of precious metal pastes used for thick film microelectronics--Determination of resolutionGB/T 17473.6-19981999-3-1
Test methods of precious metal pastes used for thick film microelectronics--Determination of viscosityGB/T 17473.5-19981999-3-1
Test methods of precious metal pastes used for thick film microelectronics--Determination of solids contentGB/T 17473.1-19981999-3-1
Standard test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconductivity decayGB/T 1553-19971997-1-2
methods for measuring conductivity type of extrinsic semiconducting materialsGB/T 1550-19971997-1-2
STANDARD spectrum tables of microwave plasma torch-atomic emitting spectrum of rare earthGB/T 16481-19961997-1-1
Silicon slices and wafers-Measuring of diameter-Micrometer methodGB/T 14140.2-19931993-10-1
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