2025-12-14 10.2.82.121
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GB/T 46559-2025 Index system for site assessment of geologic carbon dioxide storage 
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GB/T 46713.1-2025 Railway applications—Rolling stock—Batteries for auxiliary power supply systems—Part 1: General requirements 
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GB/T 37539-2025 Corrosion control engineering life cycle in fossil fuel power plants—General requirements 
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GB/T 46687.1-2025 Expression of machine language for standard—Part 1: General requirements for basic architecture and elements expression 
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GB/T 37932-2025 Data security technology—Security requirements for data transaction service 
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GB/T 46696-2025 Specification for permanent solder mask 
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GB/T 46712-2025 Directives for comprehensive evaluation of operation and risk prevention and control level of unattended operation station 
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GB/T 38387-2025 Noise-reducing rubber stretchable joint device for bridges 
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GB/T 38271-2025 Plastics—Determination of residual styrene monomer in polystyrene (PS), impact-resistant polystyrene (PS-I), acrylonitrile-butadiene-styrene (ABS) and styrene-acrylonitrile (SAN) resin—Gas chromatography 
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GB/T 46764-2025 Wind energy generation systems—Availability 
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GB/T 2406.4-2025 Plastics—Determination of burning behaviour by oxygen index—Part 4: High gas velocity test 
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GB/T 15445.3-2025 Representation of results of particle size analysis—Part 3:Adjustment of an experimental curve to a reference model 
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GB/T 4937.25-2025 Semiconductor devices—Mechanical and climatic test methods—Part 25: Temperature cycling 
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GB/T 4937.44-2025 Semiconductor devices—Mechanical and climatic test methods—Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices 
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GB/T 4937.33-2025 Semiconductor devices—Mechanical and climatic test methods—Part 33: Accelerated moisture resistance—Unbiased autoclave 
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GB/T 4937.38-2025 Semiconductor devices—Mechanical and climatic test methods—Part 38: Soft error test method for semiconductor devices with memory 
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GB/T 19466.8-2025 Plastics—Differential scanning calorimetry (DSC) method—Part 8:Determination of thermal conductivity 
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GB/T 4937.36-2025 Semiconductor devices—Mechanical and climatic test methods—Part 36:Acceleration，steady state 
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GB/T 4937.24-2025 Semiconductor devices—Mechanical and climatic test methods—Part 24: Accelerated moisture resistance—Unbiased HAST 
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GB/T 14896.10-2025 Non-traditional machines—Terminology—Part 10：Electroforming machines 
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