Code of China Chinese Classification Professional Classification ICS Classification Latest Value-added Services

LoginRegister

Title Standard No. Implemented On
Residential and commercial water treatment equipmentT/NHAIA 004-2016
Enterprise standardization—Evaluation and improvementGB/T 19273-20172018-7-1
Evaluation system of industrialization for scientific and technical achievementT/CSPSTC 3-20172018-2-1
Transformation guidelines of geographical names from foreign languages into Chinese―Part 9:PersianGB/T 17693.9-20172017-12-29
Evaluation systems for enterprise innovation influenceT/CSPSTC 1-20172017-12-15
Evaluation systems for industrial park innovation influenceT/CSPSTC 2-20172017-12-15
Specification for inspecting exit cultural relics--Part 14:LacquerwareGB/T 33290.14-20162017-7-1
Corrosion control engineering life cycle--General requirementsGB/T 33314-20162017-7-1
Specification for inspecting exit cultural relics--Part 12: Clock and watchGB/T 33290.12-20162017-7-1
Specification for inspecting exit cultural relics--Part 4: InstrumentsGB/T 33290.4-20162017-7-1
Specification for inspecting exit cultural relics--Part 13: WeaponGB/T 33290.13-20162017-7-1
Specification for inspecting exit cultural relics--Part 15: Musical instrumentGB/T 33290.15-20162017-7-1
Specification for inspecting exit cultural relics--Part 5: Ceremonial articleGB/T 33290.5-20162017-7-1
Specification for inspecting exit cultural relics--Part 16: Writing brush, ink stick, paper and inkstoneGB/T 33290.16-20162017-7-1
Specification for inspecting exit cultural relics--Part 17: Snuff bottle and fanGB/T 33290.17-20162017-7-1
Specification for welfare-lottery-system-document testMZ/T 081-20172017-1-6
Specification for welfare-lottery-game-rules testMZ/T 077-20172017-1-6
Specification for welfare-lottery-system-software testMZ/T 079-20172017-1-6
Specification for welfare-lottery-game-rules conformity-testingMZ/T 078-20172017-1-6
Specification for welfare-lottery-system-software security-testingMZ/T 080-20172017-1-6
Regulation on compiling construction standard for land consolidation and rehabilitation engineeringTD/T 1045-20162016-8-1
Industry water-use quotaDB21/T 1237-20152015-7-18
Rating specification for applied competence of innovation methodGB/T 31769-20152015-7-1
Mobile laboratory―Guidance on ergonomic principlesGB/T 31019-20142015-2-1
Mobile laboratory―Modular design guideGB/T 31018-20142015-2-1
Requirement on Services of Dangerous Goods Transportation for International Freight ForwardersGB/T 30347-20132014-7-1
Norms of Credit Management on International Logistics EnterprisesGB/T 30345-20132014-7-1
Requirement on Services of International Exhibit TransportationGB/T 30348-20132014-7-1
Specification for the structure of E-COSB/T 11006-20132013-11-1
Design principles and basic requirements for mobile laboratoryGB/T 29475-20122013-7-31
Evaluating guide for raw material saving of industrial enterprisesGB/T 29115-20122013-6-1
General principles for calculation of raw material consumption in industrial enterprisesGB/T 29116-20122013-6-1
Requirments on services of preparation for international freight forwarding documentsGB/T 28832-20122012-12-1
Credit evaluating index elements for international logistics enterprisesGB/T 28836-20122012-12-1
Valuation standard for ready-mixed mortar and equipment enterprisesSB/T 10723-20122012-11-1
Quality management specification of dry-mixed mortarSB/T 10647-20112012-1-1
Chinese restaurant kitchen management regulations in the catering industryDB31/T 526-20112011-11-1
Rehabilitation service information guidelines for the old and individuals with disabilitiesGB/T 24433-20092009-12-1
Project management - Areas of knowledgeGB/Z 23693-20092009-10-1
Code for technology of bulk cement deliver goods station of countrySB/T 10516-20082009-8-1
Requirement on services of international freight forwardersGB/T 22154-20082008-12-1
General specification for the logistics center operationGB/T 22126-20082008-12-1
International freight forwarders trading conditionsGB/T 22153-20082008-12-1
Qualifications and evaluation indicators for international freight forwarding enterprisesGB/T 22155-20082008-12-1
Logistics quantitative forecastWB/T 1039-20082008-12-1
Basic technical condition of cotton processing enterpriseGB/T 18353-20012001-6-1
Guidelines for complaints handlingGB/T 17242-19981998-10-1
Solder wire for soldering cleanout-freeSJ/T 11168-19981998-5-1
General specification for surface mounting adhesivesSJ/T 11187-19981998-5-1
Encapsulation materials of phenolic series for use in electronic componentsSJ/T 11126-19971998-1-1
Encapsulation materials of epoxy series for use in electronic componentsSJ/T 11125-19971998-1-1
Zirconium dioxide used for electronic ceramicsSJ/T 11136-19971998-1-1
Management system for design documents Part 5: Revisions of design documentsSJ/T 211.5-19971998-1-1
Determination of Co2O3 NiO and MnO2 in electronic glass - Atomic absorption methodSJ/T 10897-19961997-1-1
Test method for gold,silver and their alloy brazing for electronic devices-Test method for spitteringSJ/T 10755-19961997-1-1
Analytical methods for silver copper brazing for electron device Determination of lead by atomic absorption spectrophotometrySJ/T 11025-19961997-1-1
Test method for chromium film and photoresist thickness of chrome blanksSJ/T 10859-19961997-1-1
Methods of analysis for silver-copper brazing for electronic devices - Determination of bismuth (spectrophotometric-atomic absorption method)SJ/T 11023-19961997-1-1
Test method for annealing point and strain point of electronic glassSJ/T 11039-19961997-1-1
Method of analysis for pure silver brazing for electronic devices - Determination of magnesium and zinc (spectrophotometric-atomic absorption method)SJ/T 11012-19961997-1-1
Determination of arsenic (As2O3) in electronic glassSJ/T 10900-19961997-1-1
prepreg for use as bonding sheet material in the fabrication of multilayer printed boardsSJ/T 11050-19961997-1-1
Tungsten heater elementSJ/T 11063-19961997-1-1
Preparation of outline drawings of cathode-ray tubesSJ/T 11081-19961997-1-1
Test method for softening point of electronic glassSJ/T 11038-19961997-1-1
Methods of analysis for gold-copper brazing for electronic devices - Determination of copper (Volumetric - EDTA method)SJ/T 11028-19961997-1-1
Test method for d.c. disruptive strength of electronic glassSJ/T 11034-19961997-1-1
Stranded tungsten wireSJ/T 11062-19961997-1-1
Determination of lead oxide in electronic glass - Extraction/EDTA complexometric titration methodSJ/T 10905-19961997-1-1
Dumet wireSJ/T 11064-19961997-1-1
Test method for high frequency dielectric losses and permittivity of electronic glassSJ/T 11043-19961997-1-1
Type designation system for glass used in electronic applicationsSJ/T 10794-19961997-1-1
Methods of measurement for camera tube yoke assembliesSJ/T 10918-19961997-1-1
Methods of analysis for pure silver drazing fro electronic devices - Determination of phosphorus (spectrophotometric phosphomolybdate method)SJ/T 11017-19961997-1-1
Test methods of VSWR of the waveguide feed-system for marine radarSJ/T 11098-19961997-1-1
Measurements of electrical properties of disk-seal tubes-Methods of measurement resonator unloaded QSJ/T 10867-19961997-1-1
Determination of zirconia in electronic glassSJ/T 10899-19961997-1-1
Methods of analysis for pure silver brazing for electronic devices-Determination of sulfur (iodimetric combustion method)SJ/T 11018-19961997-1-1
Potassium silicate solution for use in electronic industry - Methods of calculation of concentration and modulusSJ/T 10925-19961997-1-1
Measurements of electrical properties of disk-seal tubes - Methods of measurement for the frequency response characteristicSJ/T 10865-19961997-1-1
Methods of analysis for gold-copper and gold-nickel brazing for electronic devices-Determination of zinc (spectrophotometric atomic absorption method)SJ/T 11032-19961997-1-1
Terms for glass used in electronic applicationsSJ/T 10793-19961997-1-1
Methods of analysis for pure silver brazing for electronic devices - Determination of bismuth (spectrophotometric strychnine-potasssium iodide method)SJ/T 11016-19961997-1-1
Methods of analysis for silver-copper brazing for electronic devices - Determination of magnesium (spectrophotometric-atomic absorption method)SJ/T 11027-19961997-1-1
Determination of Li2O Na20 and K20 in electronic glass - Atomic absorption methodSJ/T 10894-19961997-1-1
Test method for gold, silver and their alloy brazing for electronic devices - Test method for cleannessSJ/T 10754-19961997-1-1
Determination of alumina (Al2O3) and zine oxide (ZnO) in electronic glass - EDTA complexiometric titration methodSJ/T 10908-19961997-1-1
Measurements of electrical properties of disk-seal tubes - Methods of measurement for AM - PM conversion coefficientSJ/T 10870-19961997-1-1
Potassium silicate solution for use in electronic industry - Methods of determination of nickelSJ/T 10928-19961997-1-1
Determination of boron oxide(B2O3) in electronic glassSJ/T 10903-19961997-1-1
Methods of analysis for gold-copper and gold-nickel brazing for elelctronic devices - Determination of phophorus (spectrophotometric method)SJ/T 11031-19961997-1-1
Method of measurement for residue stress in color picture tube bulbsSJ/T 10936-19961997-1-1
Requirements for camera tube yoke assembliesSJ/T 10917-19961997-1-1
Method of analysis for pure silver brazing for electronic devices - Determination of lead (spectrophotometric-dithizone method)SJ/T 11011-19961997-1-1
Determination of manganese dioxide in electronic glass - Potassium periodate oxidation methodSJ/T 10901-19961997-1-1
Potassium silicate solution for use in electronic industry - Methods for determination of chloriteSJ/T 10930-19961997-1-1
Methods of analysis for pure silver brazing for electronic devices-Determination of Pb, Bi, Zn, Cd, Fe, Mg, Al, Sn and Sb (spectrochemical method)SJ/T 11019-19961997-1-1
Test method for thermal shock of electronic glassSJ/T 11037-19961997-1-1
Methods of analysis for pure silver brazing for electronic devices - Determination of iron (spectrophotometric-O-phenanthroline method)SJ/T 11015-19961997-1-1
Gold,silver and their alloy brazing for electronic devicesSJ/T 10753-19961997-1-1
Determination of iron oxide and titania in electronic glass - Photometric methodSJ/T 10898-19961997-1-1
Test method for chemical stability for water resistance of electronic glassSJ/T 11035-19961997-1-1
Designations for names and models of structure ceramic materials for electronic componentsSJ/T 10760-19961997-1-1
Determination of baryta (BaO) in electronic glass-Barium sulfate weight methodSJ/T 10906-19961997-1-1
Methods of analysis for pure silver brazing for electronic devices - Determination of antimony (spectrophotometric-malichite green method)SJ/T 11014-19961997-1-1
Measurement of electrical properties of disk-seal tubes-GeneralSJ/T 10864-19961997-1-1
Methods of analysis for silver-copper brazing for electronic devices-Determination of antimony (spectrophotometric-atomic absorption method)SJ/T 11024-19961997-1-1
Determination of ZnO PbO Al2O3 and Sb2O3 in electronic glass - Atomic absorption methodSJ/T 10896-19961997-1-1
General specification for lead-tinned for electronic componentsSJ/T 11091-19961997-1-1
Methods of analysis for gold-copper and gold-nickel brazing for electronic devices-Determination of lead (spectrophotometric dithizone method)SJ/T 11030-19961997-1-1
Determination of alumina (A12O3) in electronic glass - EDTA complexicretric titration methodSJ/T 10907-19961997-1-1
Potassium silicate solution for use in electronic industry - Methods of determination of silica contentSJ/T 10924-19961997-1-1
General rules for chemical analysis of electronic glassSJ/T 10893-19961997-1-1
Test method for viscosity of electronic glass at high temperatureSJ/T 11040-19961997-1-1
Methods of analysis for silver-copper brazing for electronic devices - Determination of tin (spectrophotometric C21H38BrN absorption method)SJ/T 11022-19961997-1-1
Measurements of electrical properties of disk-seal tubes - Methods of measurement for self-neutralization frequencySJ/T 10868-19961997-1-1
Test method for density of electronic glass - Sink-float comparator methodSJ/T 11033-19961997-1-1
Determination of K2O Na2O and Li2O electronic glass - Flame spectroscopySJ/T 10909-19961997-1-1
Potassium silicate solution for use in electronic industry - Methods of determination of copperSJ/T 10927-19961997-1-1
Potassium silicate solution for use in electronic industry - Methods for determination of potassium carbonateSJ/T 10921-19961997-1-1
Potassium silicate solution for use in electronic industry - Methods of determination of total alkalinitySJ/T 10923-19961997-1-1
Methods of analysis for pure silver brazing for electronic devices - Determination of cadmium (spectrophotometric-atomic absorption method)SJ/T 11013-19961997-1-1
Test method for optical density of chrome blanksSJ/T 10861-19961997-1-1
Potassium silicate solution for use in electronic industry - Methods of determination of ironSJ/T 10926-19961997-1-1
Glossary of terms for production of tungsten and molybdenum wiresSJ/T 10744-19961997-1-1
The properties and the test methods for antistatic silk fabric of synthetic filament in electronic industrySJ/T 11090-19961997-1-1
Measurements of electrical properties of disk-seal tubes - Methods of measurement for power gainSJ/T 10869-19961997-1-1
Methods of analysis for silver-copper brazing for electronic devices - Determination of Pb, Bi, Zn, Cd, Fe, Mg, Al, Sn and Sb (spectrochemical method)SJ/T 11021-19961997-1-1
Detail specification for electronic components - Electronic tube of type FC-306 (Applicable for certification)SJ/T 11078-19961997-1-1
Test method for surface reflectivity of chromium film on chrome blanksSJ/T 10860-19961997-1-1
Test methods for surface flatness of glass substrate and chromium filmSJ/T 10858-19961997-1-1
Test method for temperature (Tk-100) of electronic glass with volume resistivity of 100MΩ.cmSJ/T 11042-19961997-1-1
Measurements of electrical properties of disk-seal tubes - Methods of measurement for frequency positionSJ/T 10866-19961997-1-1
Determination of fluorine in electronic glass - Specific ion electrode methodsSJ/T 10904-19961997-1-1
Determination of silica (SiO2) in electronic glassSJ/T 10902-19961997-1-1
Methods of analysis for gold-nickel brazing for electronic devices - Determination of nickel (Volumetric - EDTA method)SJ/T 11029-19961997-1-1
Test method for impact resistance of electronic glassSJ/T 11041-19961997-1-1
Methods of analysis for silver-copper brazing for electronic devices - Determination of copper (iodimetric method)SJ/T 11020-19961997-1-1
Test method for average linear thermal expansion coefficent of electronic glassSJ/T 11036-19961997-1-1
Determination of CaO SrO and MgO in electronic glass - Atomic absorption methodSJ/T 10895-19961997-1-1
Potassium silicate solution for use in electronic industry - General rules of analysisSJ/T 10922-19961997-1-1
Methods of analysis for silver-copper brazing for electronic devices - Determination of iron, cadmium and zinc (spectrophotometric-atomic absorption method)SJ/T 11026-19961997-1-1
Symbol and notation for brazing, soldering and sealingSJ/T 10667-19951996-1-1
General specification for compact fluorescent lampsSJ/T 10673-19951996-1-1
Cobalt oxide powder for electronic industrySJ/T 10676-19951996-1-1
Nickel oxide powder for electronic industrySJ/T 10677-19951996-1-1
Bismuth trioxide powder for electronic industrySJ/T 10678-19951996-1-1
Detail specification for electronic components-Fixed low-power non-wirewound fixed resistors - Type RT13 carbon film fixed resistors Assessment level ESJ/T 10617-19951995-10-1
Management system for CAD design documents-Signature of design documentsSJ/T 10629.4-19951995-10-1
Atomic-absorption spectrophotometry of impurties in alumina for electron ceramic raw materialsSJ/T 10633-19951995-10-1
Technical guides for evaluating the saving on steel products in enterprisesGB/T 15512-19951995-1-2
SJ 2003 7.2-1994 Detail specification for Type LGB2A0606 fixed inductorsSJ 2003 7.2-19941994-12-1
Method for measurement of average dislocation density of Aluminium foil for electroytic capacitorSJ/T 10557.3-19941994-12-1
Method of emission spectrochemical analysis of impurities in ZrO2 for use in electron ceramicsSJ/T 10553-19941994-12-1
Tungsten-Thorium alloy rodSJ/T 10536.2-19941994-12-1
Detail specification for air dielectric tubular (piston type) trimmer variable capacitors,Model CWG27,CWG28 and CWG29SJ 20032/1-19941994-12-1
Test method for gas emission characteristics of colloidal graphite in vacuum for use in electron tubeSJ/T 10550-19941994-12-1
Specification for Aluminium foil for electrolytic capacitorSJ/T 10557.1-19941994-12-1
Blank detail specification for compact fluorescent lampsSJ/T 10547-19941994-12-1
Detail specification for electronic components - Fixed precision, Type RJ74 metal film precision resistors Assessment level ESJ/T 10572-19941994-12-1
Detail specification for electronic components-Fixed precision resistors, Type RJ73 metal precision resistors Assessment level ESJ/T 10571-19941994-12-1
Blank detail specification for electron gun of black-and white picture tubeSJ/T 10545-19941994-12-1
Detail specification for electronic components-Fixed precision resistors, Type RJ75 metal film precision resistors Assessment level ESJ/T 10573-19941994-12-1
SJ 2003 7.1-1994 Detail specification for Type LGA2A0410 fixed inductorsSJ 2003 7.1-19941994-12-1
Blank detail specification for panel of colour picture tue bulbsSJ/T 10548-19941994-12-1
Method of emission specthochemical analysis of impurities in TiO2 for use in electron ceramicsSJ/T 10552-19941994-12-1
General specification for particular fluorescent lampsSJ/T 10546-19941994-12-1
General specification for colour picture tube bulbsSJ/T 10543-19941994-12-1
Blank detail specification for funnel of colour picture tube bulbsSJ/T 10549-19941994-12-1
Method of emission spectrochemical analysis of impurities in AL203 for use in electron ceramicsSJ/T 10551-19941994-12-1
Detail specification for electronic components-Fixed precision resistors,Type RJ76 metal film precision resistors Assessment level ESJ/T 10574-19941994-12-1
Exterior collidal graphite for black and white picture tubesSJ/T 10556-19941994-12-1
Blank detail specification for colour display tubesSJ/T 10544-19941994-12-1
Tungsten-Thorium alloy wiresSJ/T 10536.1-19941994-12-1
Generic specification for traffic speed measuring redar at zero angleSJ/T 10443-19931994-6-1
Test methods for bulk resistivity of organic film for use in capacitorsSJ/T 1146-19931994-6-1
Test method for breakdown strength of organic film for use in capacitorsSJ/T 1148-19931994-6-1
Quality control pivot of production for high power ceramic transmitting tubesSJ/T 10421-19931994-6-1
Glass powder for passivation packaging for use in semiconductor devicesSJ/T 10424-19931994-6-1
Generic specification for electron gun of black-and-white picture tubesSJ/T 10408-19931994-6-1
Blank detail specification for black-and-white picture tube bulbsSJ/T 10409-19931994-6-1
Generic specification for traffic speed measuring radar at one angleSJ/T 10442-19931994-6-1
Guidelines of quality engineering control for electronic beam tubesSJ/T 10467-19931994-6-1
CAD symbol base for use in electronic products drawingsSJ/T 10385-19931994-1-1
Filling-in for technological document formatSJ/T 10375-19931993-12-1
General terms used for technological clocumentsSJ/T 10376-19931993-12-1
CAD table base for use in electronic productsSJ/T 10378-19931993-12-1
Organic film paint for black and white picture tubesSJ/T 10343-19931993-10-1
SJ 2005 7-1992 Semiconductor discrete device - Detail specification for silicon NPN low power switching transistor of Type 3DK104SJ 2005 7-19921993-5-1
Semiconductor discrete device-Detail specification for silicon NPN high-frequency low power transistor of Type 3DG111SJ 20059-19921993-5-1
Semiconductor discrete device-Detail specification for silicon NPN low power switching transistor of Type 3DK101SJ 20054-19921993-5-1
Semiconductor discrete device-Detail specification for silicon NPN low power switching transistor of Type 3DK105SJ 20058-19921993-5-1
Semiconductor discrete device-Detail specification for silicon NPN high-frequency low power transistor of Type 3DG120SJ 20060-19921993-5-1
SJ 2005 5-1992 Semiconductor discrete device - Detail specification for silicon NPN low power switching transistor of Type 3DK102SJ 2005 5-19921993-5-1
Ceramic base body for use in metal film fixed resistorsSJ/T 10322-19921992-12-1
Completeness of technological documentSJ/T 10324-19921992-12-1
SJ 2005 2-1992 Detail specification for switch, waveguide, electromechanical operated, 1P2T, fail-safe, Model KB-84SJ 20052-19921992-5-1
Methods of measurement for short wave single sideband setSJ 20043-19921992-5-1
Semiconductor discrete device. Detail specification for silicon N-channel depletion mode field-effect transistor of types CS4 GP, GT and GCT classesSJ 20012-19921992-5-1
SJ 2002 8-1992 General specification for VHF/FM vehicle radioSJ 2002 8-19921992-5-1
SJ 2004 9-1992 Electrization installation requirement for fiber-optical communication equipment of stationary groundSJ 2004 9-19921992-5-1
General specification of mechanical and physical design and manufacturing for military electronic equipmentsSJ 20053-19921992-5-1
General specification for VHF/FM vehicle radioSJ 20028-19921992-5-1
Safety requirements for short wave single sideband communication equipmentSJ 20044-19921992-5-1
SJ 2004 6-1992 General specification for portable non - Metallic mine detectorsSJ 2004 6-19921992-5-1
Rotary solenoid,General specification forSJ 20038-19921992-5-1
Generic specification for 4800bit/s wire voice-band modemsSJ 20040-19921992-5-1
Evaluation method of residual intelligibility for analog-voice scramblers (RIAVS)SJ 20041-19921992-5-1
SJ 2003 9-1992 Brushless miniature D.C. blower, General specification forSJ 2003 9-19921992-5-1
General specification for air-conduction dynamic and electro magnetic transmittersSJ 20045-19921992-5-1
SJ 2002 0-1992 Detail specification for transmitting tube of Type FU100FSJ 2002 0-19921992-5-1
Measuring methods of traveling wave tubeSJ 20024-19921992-5-1
SJ 2001 8-1992 Detail specification for disk-seal tube of Type FM24SJ 20018-19921992-5-1
Semiconductor discrete device. Detail specification for PNP silicon low-power transistor for types 3CG110 GP, GT and types GCT classesSJ 20014-19921992-5-1
Generic specification for gas snesors of metal-oxide semiconductorSJ 20025-19921992-5-1
Detail specification for air dielectric tubular (piston type) trimmer variable capacitor,Model JCWG31SJ 20033-19921992-5-1
Detail specification for air dielectric tubular (piston type) trimmer variable capacitor,Model JCWG32SJ 20035-19921992-5-1
SJ 2004 8-1992 Machinery installation requirement for fiber-optical communication equipment of statuionary groundSJ 2004 8-19921992-5-1
Generic specification of vacuum capacitorsSJ 20030-19921992-5-1
Detail specification for air dielectric tubular (piston type) trimmer variable capacitor,Model JCWG26SJ 20034-19921992-5-1
SJ 2003 7-1992 Coils fixed and variable, radio frequercy, General specification forSJ 2003 7-19921992-5-1
General specification for air dielectric vare trimmer variable capacitorsSJ 20031-19921992-5-1
SJ 2004 0-1992 General specification for 4800bit/s wire voice-band modemsSJ 2004 0-19921992-5-1
Semiconductor discrete device. Detail specification for PNP silicon low-power high-reverse-voltage transistor for types 3DG182 GP, GT and types GCT classesSJ 20016-19921992-5-1
Detail specification for MF11 directly heated negatice temperature coefficient thermistorSJ 20047-19921992-5-1
Measuring methods for gas sensors of metal oxide semiconductorSJ 20026-19921992-5-1
Specification for Barium sodium polassium glass for military electronic devices and componentsSJ 20036-19921992-5-1
SJ 2004 2-1992 Methods of measurement for tropsphering scattering communication equipmentSJ 2004 2-19921992-5-1
Detail specification for tranmitting tube of Type FU251FSJ 20022-19921992-5-1
SJ 2002 1-1992 Detail specification for transmitting tube of Type FU101FSJ 2002 1-19921992-5-1
Principles and requirements for preparing diagrams of STANDARD systemGB/T 13016-19911992-4-1
Detail specification for electronic components-Photo tube of type GD-24 (Applicable for certification)SJ/T 10248-19911992-1-1
Methods of determination for density of potassium silicate solution for use in electronic industrySJ/T 10226-19911991-12-1
Graphic and Symbol base for electronic products CAD drawing standard architecture part graphicSJ/T 10224-19911991-12-1
A-Ceramic for microwave dielectric materialsSJ/T 10246-19911991-12-1
Graphic base of electronic components graphics of semiconductor discrete deviceSJ/T 10149-19911991-12-1
Key points for manufacture quality control of picture-tubes(black and white picture-tubes)SJ/T 10220-19911991-12-1
Microwave ceramic dielectric materials-Alumina ceramic substrates for microwave integrated circuitsSJ/T 10243-19911991-12-1
Microwave ceramic dielectric materials-Microwave composite dielectric substrateSJ/T 10245-19911991-12-1
Methods of determination for viscosity of potassium silicate solution for use in electronic industrySJ/T 10227-19911991-12-1
Model 714 Weather radarSJ/T 10192-19911991-12-1
Test methods for frequency character of marine radar transmittersSJ/T 10295-19911991-12-1
Microwave ceramic dielectric materials-Rutile for microwave dielectric materialsSJ/T 10244-19911991-12-1
Graphic base of electronic components graphics for resistor capacitor and inductorSJ/T 10150-19911991-12-1
Key points for manufacture quality control of thin film resistorsSJ/T 10219-19911991-12-1
Cadmium sulfide for use in phosphorsSJ/T 10089-19911991-7-1
Methods of chemical analysis for glass raw materials for colour picture tubes - Methods for chemical analysis of cerium hydrateSJ/T 10087.6-19911991-7-1
Methods of chemical analysis for glass raw materials for colour picture tubes - Methods for chemical analysis for arenaceous quartzSJ/T 10087.1-19911991-7-1
Test methods for complex permittivity of solid dielectric in microwave frequency band - Method for reentering into gravitySJ/T 10143-19911991-7-1
Detail specification for electronic components. Silicon-target vidicon of type SF-1303SJ/T 10032-19911991-7-1
Methods of chemical analysis for glass raw materials for colour pictrue tubes - Methods for chemical analysis of feldsparSJ/T 10087.3-19911991-7-1
Detail specification for electronic components Electronic tube of type FU-605 (Applicable for certification)SJ/T 10036-19911991-7-1
Methods of chemical analysis for glass raw materials for colour picture tubes - Methods for chemical analysis of Sodium fluorosilicateSJ/T 10087.7-19911991-7-1
Zine sulfide for use in phosphorsSJ/T 10088-19911991-7-1
Hydrogen thyratron,Type ZQM1-325/16SJ/T 10033-19911991-7-1
Methods of chemical analysis for glass raw materials for colour picture tubes-Methods for chemical analysis of dolomiteSJ/T 10087.2-19911991-7-1
Detail specification for electronic components Electronic tube of type FC-620F (Applicable for certification)SJ/T 10035-19911991-7-1
The methods for detemination of ZnS and CdS for use in phosphorsSJ/T 10090-19911991-7-1
Preparation methods for electrical skeletons--Terminology, classification and preparation principlesSJ/T 10148.1-19911991-7-1
Terms for cryelectronicsSJ/T 10141-19911991-7-1
Methods for chemical analysis for glass raw materials for colour picture tubes - Methods for chemical analysis of sodium pyroautimonateSJ/T 10087.8-19911991-7-1
Test methods for complex pemittivity of dielectric material in microwave frequency band-Method for terminal open circuit of coaxial feederSJ/T 10142-19911991-7-1
Methods of chemical analysis for glass raw materials for colour picture tubes - Methods for chemical analysis of lithargeSJ/T 10087.5-19911991-7-1
Terms for superconductor electronicsSJ/T 10140-19911991-7-1
Methods of chemical analysis for glass raw materials for colour picture tubes - Methods for chemical analysis of limestoneSJ/T 10087.4-19911991-7-1
Completeness,preparation and revision of design documents for household electronic productsSJ 2907-19871989-5-1
Copper-plated Iron wire and Nickel-plated Iron wire for vacuum divicesSJ 3269-19891989-3-25
Determination of Lead in high purity arenaceous quartzSJ 3228.10-19891989-3-25
General specification for packaging materials for use in electronic componentsSJ 3262-19891989-3-25
Methods of measurement for chromium concentration in semi-insulation Gallium arsenide by infra-red absorptiSJ 3249.3-19891989-3-25
Determination of Chromium in high purity arenaceous quartzSJ 3228.7-19891989-3-25
Specification for high purty arenaceous quartz for use in electronic industrySJ 3228.1-19891989-3-25
Supports and glass bar of electron gun for vacuum electronic devicesSJ 3233-19891989-3-25
Ribbon getter made of Zirconium and AluminiumSJ 3235-19891989-3-25
Determination of loss on ignition in high purity arenaceous quartzSJ 3228.3-19891989-3-25
Test method for dynamic relating to vacuum gas emission properties of electronic materialSJ 3234-19891989-3-25
Ribbons of Nickel-coated Iron for use in vacuum tubesSJ 3267-19891989-3-25
Gallium arsenide epitaxy wafersSJ 3242-19891989-3-25
Methods of measurement for compensation degree of Gallium arsenide and Indium phosphide materiasSJ 3244.5-19891989-3-25
Determination of Copper in high purity arenaceous quartzSJ 3228.6-19891989-3-25
Determination of Iron in high purity arenaceous quartzSJ 3228.5-19891989-3-25
General requirements of inspection procedures for preparation of measuring equipment in electronic industrySJ 3253-19891989-3-25
General rules for methods of analysis for high purity arenaceous quartzSJ 3228.2-19891989-3-25
General requirement for gas chromatography analysis methodSJ 3239-19891989-3-25
Double side Aluminium-plated Iron strips and Nickel-Iron-Aluminium alloy stripsSJ 3268-19891989-3-25
Determination of silicon oxide in high purity arenaceous quartzSJ 3228.4-19891989-3-25
Methods for measuring carrier concentration of readded Gallium arsenide and Indium phosphide by infra-red reflectionSJ 3248-19891989-3-25
Determination of Alumiuium in high purity arenacous quartzSJ 3228.8-19891989-3-25
Test methods for power function of electronic matericalsSJ 3195-19891989-3-1
General specification for antennas pedestal of shipborne radarSJ 3219-19891989-3-1
General specification for receiving system of ground radarSJ 3218-19891989-3-1
Terms related to radar countermeasuresSJ 3207-19891989-3-1
Graphic base of electronic elements - IC GraphicSJ 3181-19891989-3-1
TP abrasive for colour and black-and-white picture tubesSJ 3119-19881988-12-1
Wafer holderSJ 3118-19881988-12-1
Detail specification for electronic components - Fixed power resistors - Fixed wirewound resistors for Type RXG5 Assessment level ESJ 2862-19881988-10-1
Detail specification for electronic components - Fixed low-power non-wirewound resistors - Fixed vitreous enamel resistors for Type RI40 Assessment level ESJ 2867-19881988-10-1
Detail specificatioin for electronic components-Fixed power resistors-Fixed wirewound resistors for Type RXG6 Assessment level ESJ 2863-19881988-10-1
Detail specification for electronic components - Fixed power resistors - Fixed wirewound resistors for Type RXG7 Assessment level ESJ 2864-19881988-10-1
Detail specification for electronic components-Fixed low-power non-wirewound resistors-Metal film resistors for Type RJ20 Assessment level ESJ 2868-19881988-10-1
Sockets for colour picture tubes,Type GZS8-6-2SJ 3160-19881988-10-1
Detail specification for electronic components - Fixed power resistors - Fixed wirewound resistors for Type RXG2 Assessment level ESJ 2859-19881988-10-1
Sockets for colour picture tubes, Type GZS10-3-1SJ 3163-19881988-10-1
Detail specification for electronic components-Fixed low-power non-wirewound resistors-Ceramic package fuse resistors for Type RF11 Assessment level ESJ 2866-19881988-10-1
Sockets for colour picture tubes,Type GZS12-4-4SJ 3167-19881988-10-1
Sockets for colour picture tubes,Type GZS12-4-1SJ 3164-19881988-10-1
Detail specification for electronic components - Fixed low-power non-wirewound resistors - Coating fuse resistors for Type RF10 Assessment level ESJ 2865-19881988-10-1
Sockets for colour picture tubes,Type GZS12-4-3SJ 3166-19881988-10-1
Detail specification for electronic components-Fixed power resistors-Fixed wirewound resistors for Type RXG4 Assessment level ESJ 2861-19881988-10-1
Detail specification for electronic components - Fixed power resistors - Fixed wirewound resistors for Type RXG3SJ 2860-19881988-10-1
Tests for flammability of plastic materials used for parts and components in electric devices and equipmentSJ/Z 9132-19871988-1-5
Provision and requirements for preparation and revision of technical standards for electronic industry-Procedures for review of standards drafs by correspondenceSJ 1.5-19871988-1-1
Requirements for complete documents and related materials when standards drafts submitted for approvalSJ 1.7-19871988-1-1
Provision and requirements for preparation and revision of technical standards for electronic industry-Requirements for contents of submitted reports concerning draft standardsSJ 1.11-19871988-1-1
Requirements for review of draft standards by technical committees for professional standardizationSJ 1.12-19871988-1-1
Provision and requirements for preparation and revision of technical standards for electronic industry-Principles and procedures for regulation of standards-preparation plansSJ 1.2-19871988-1-1
Principles and procedures for return of submitted standards drafts for approvalSJ 1.9-19871988-1-1
Development of responsibilities for lead units responsible for technical standards preparation in electronic industrySJ 1.3-19871988-1-1
Provision and requirements for preparation and revision of technical standards for electronic industry-Requirements that should be followed during standards-writingSJ 1.8-19871988-1-1
Provision and requirements for preparation and revision of technical standards for electronic industry - Main contents of minutes made at meetings for reviewing draft standardsSJ 1.10-19871988-1-1
Procedures and provision for submission and approval of technical standards in electronic industrySJ 1.6-19871988-1-1
Major procedures and requirements for working out of annual plans relating to technical standards in electronic industrySJ 1.1-19871988-1-1
Stages - Division and requirements for implementation of standards-preparation in electronic industrySJ 1.4-19871988-1-1
Method of analysis for overall activation process of non-evaporable getrters (catmasphere method)SJ/Z 2782-19871987-12-31
Nickel and Nickel alloy bars for vacuum tubesSJ 1539-19871987-12-1
Method for chemical analysis of Nickel and Nickel alloy for vacuum tubesSJ 1542-19871987-12-1
Method for spectral analysis of Nickel and Nickel aloy for vacuum tubesSJ 1543-19881987-12-1
Nickel and Nickel alloy strips for vacuum tubesSJ 1541-19871987-12-1
Nickel and Nickel alloy wires for use in vacuum devicesSJ 1540-19871987-12-1
Compositions of Nickel and Nickel alloy for vacuum tubesSJ 1538-19871987-12-1
Guide for the choice of colour to be used for the marking of capacitors and resistorsSJ/Z 9022.1-19871987-10-12
Attached documents for radar productsSJ 2785-19871987-10-1
Detail specification for electronic components-Fixed power resistors-Fixed wirewound power resistors for Type RXG1 Assessment level ESJ 2746-19871987-10-1
Character styles and symbols for electronic productsSJ 2715-19861987-10-1
Measurements of electrical properties of electronic tubes - Part 14: Methods of measurement of radar and osciloscope cathode-ray tubesSJ/Z 9010.14-19871987-9-14
Measurements of electrical properties of electronic tubes - Part 24: Methods of measurement for cathode-ray charge-storage tubesSJ/Z 9010.24-19871987-9-14
Methods for measurement of direct interelectrode capacitances of electronic tubes and valvesSJ/Z 9009-19871987-9-14
Measurement of electrical properties of microwave tubes - Part 2: General measurementsSJ/Z 9008.2-19871987-9-14
Measurements of incidental ionizing radation from electronic tubesSJ/Z 9013-19871987-9-14
Measurement of electrical properties of microwave tubes--Part 7: Gas-filled microwave switching devicesSJ/Z 9008.6-19871987-9-14
Measurements of electrical properties of electronic tubes and valves--Part 20: Methods of measurement for thyratron pulse modulatorsSJ/Z 9010.20-19871987-9-14
Measurements of electrical properties of electronic tubes and valves--Part 15: Methods of measurement for spurious and unwanted electrode currentsSJ/Z 9010.15-19871987-9-14
Measurement of electrical properties of electronic tubes Part 26 Methods of measurement for camera tubesSJ/Z 9010.26-19871987-9-14
Measurements of electrical properties of electronic tubes and valves - Part 21: Methods of measurement for cross-modulation in electronic tubes and valvesSJ/Z 9010.21-19871987-9-14
Measurements of electrical properties of electronic tubes and valves--Part 9: Methods of measuring the cathode-interface impedanceSJ/Z 9010.9-19871987-9-14
Measurement of electrical properties of microwave tubes - Part 4: MagnetronsSJ/Z 9008.3-19871987-9-14
Measurements of electrical properties of electronic tubes and valves--Part 17: Methods of measurement for gasfilled tubes and valvesSJ/Z 9010.17-19871987-9-14
Measurement of electrical properties of microwave tubes - Part 9: Crossed-field amlifier tubesSJ/Z 9008.8-19871987-9-14
Mechanical standardization of semiconductor devices - Part 1: Preparation of drawings of semiconductor devicesSJ/Z 9021.1-19871987-9-14
Numbering of electrodes and designation of units in electronic tubes and valvesSJ/Z 9018-19871987-9-14
Method of measurement by infra-red reflection for charge carrier concentraiton of heavily doped semiconductorsSJ 2757-19871987-7-1
Test procedures for antennas - Determination of radiation efficiencySJ 2534.11-19871987-6-1
Test procedures for antennas-Special measurement for angle-tracking antennasSJ 2534.12-19871987-6-1
Test procedures for antennas - Electromagnetic radiation hazardsSJ 2534.13-19871987-6-1
Drawing rules for electronic productsSJ 2735-19861986-12-1
Detail specification for electronic components - Fixed low-power non-wirewound resistors - Fixed metal film resistor, Type RJ17 Assessment level ESJ 2675-19861986-10-1
Specification of marine navigational radar equipment for Type 756SJ 2662-19861986-10-1
Method for defermination of Tungsten by spectrometrySJ 2656-19861986-10-1
Test methods for resin type flux for soft solderSJ 2660-19861986-10-1
Collection of single crystal Germaninm defectsSJ/Z 2655-19861986-10-1
Test procedrues for antennas - Phase measurementSJ 2534.8-19861986-10-1
Mothod of molybdeuum spectral analysisSJ 2657-19861986-10-1
Test procedures for antennas-On-site measurements of amplitude pattensSJ 2534.7-19861986-10-1
Detail specification for electronic components - Fixed low-power non-wirewound resistors - Fixed metal film resistors for Type RJ16 Assessment level ESJ 2674-19861986-10-1
Resin-core solder tin wire for electronic industrySJ 2659-19861986-10-1
Test procedures for antennas - Measurement of power gain and directivitySJ 2534.10-19861986-10-1
Test procedures for antennas-Antenna-range operationSJ 2534.6-19851986-7-1
Test procedures for antennas-Measurement of impedancesSJ 2534.14-19851986-7-1
Test procedures for antennas - Environmental factorsSJ 2534.15-19871986-7-1
Test procedures for antennas-Antenna-range evaluationSJ 2534.4-19851986-7-1
Test procedures for antennas-Special measurement techniquesSJ 2534.5-19851986-7-1
Test procedures for antennas-Measurement of power-capacitySJ 2534.16-19871986-7-1
Test procedures for antennas-Antenna-range designSJ 2534.2-19851986-7-1
Test procedures for antennas-Polarization measurementSJ 2534.9-19851986-7-1
Reliability monitoring programs for use during research and development of radar equipmentSJ 2585-19851986-1-1
Pure silicon tetrachlorideSJ 2593-19851986-1-1
Single crystal silicon rods and wafers for solar cellsSJ 2572-19851985-10-1
Prefered series of camera tubesSJ 2526-19841985-7-1
General specification for high-voltage and high-power pulse generating networks used in radarSJ 2532-19841985-7-1
General specification for high-voltage and high-power pulse transformers used in radarSJ 2533-19841985-7-1
Test procedures for antennas - Antenna-range instrumentationSJ 2534.1-19841985-7-1
Test procedures for antennas - Antenna-range measurements of radiation patternsSJ 2534.3-19841985-7-1
Test method of heater intermittence for transmitting tubesSJ 2477-19841985-1-1
Methods for tensile testing of fine metal wiresSJ 2425-19831984-10-1
Optimum diameters of leads of capacitors and resistorsSJ 2420-19831984-6-1
Test methods for elasticity modulus and loss factor of paper stock for loudspeakersSJ 2317-19831983-10-1
Specification for paper stock for use in loudspeakersSJ 2316-19831983-10-1
Gas-filled microwave switching tubes,Type RX-54SJ 2244-19821983-7-1
Epoxy powder for coatingsSJ 2168-19821983-7-1
Method of measurement of granularity of cathode carbonateSJ 2253-19821983-7-1
General requirements for analysis of cathode carbonate (Provisional)SJ 2254-19821983-7-1
Pulsed magnetrons, Type CKM-29B, CKM-29D, CKM-29E, CKM-29F, CKM-29GSJ 2109-19821983-1-1
Method of accelerated life test for oxide cathodeSJ 2133-19821983-1-1
Interior graduation for cathode-ray tubesSJ 2130-19821983-1-1
Miorocrystal glass substrates for use in thick film integrated circuitsSJ 2154-19821983-1-1
Power travelling wave tubes, Type B-211SJ 2012-19821982-7-1
Electronic tubes, Type FU-824S(F)SJ 1676-19811982-6-1
Fluorescent character indicator tubes, Type YS9-3SJ 1861-19811982-6-1
Fluorescent character indicator tubes,Type YS13-3SJ 1862-19811982-6-1
Measurement of AM-PM conversion coefficient of power klystronsSJ 1860-19811982-6-1
Electronic tubes,Type FU-113Z(F)SJ 1802-19811982-1-1
Gas-filled microwave switching tubes,Type RX-56SJ 1724-19811981-7-1
Method of accelerated life test of low power electronic tubesSJ 1703-19811981-7-1
Pulsed magnetrons,Type CKM-14HSJ 1627-19801981-3-1
Pulse modulator tubes,Type TM-90(J)SJ 1620-19801981-1-1
Method of analysis of Thorium oxide and Rhenium in Thorium-Tungsten-Rhenium wire for use in vacuum devicesSJ 1591-19801981-1-1
Spiral anode X-ray tubes, Type XD51-20. 40/100 and XD51-20. 40/125SJ 1596-19801981-1-1
Tungsten-Thorium-Rhenium wires for vacuum tubesSJ 1587-19801981-1-1
Methods for analysis of Cerium oxide in Cerium-Tungsten powder,plates and barsSJ 1590-19801981-1-1
Transmitting tubes, Type FU23S(Z)SJ 1598-19801980-12-1
Electronic tubes,Type FM-150SJ 1666-19801980-11-11
Electronic tubes,Type FM-12FSJ 1667-19801980-11-11
Continuous wave magnetrons,Type CK-140BSJ 1546-19791980-6-1
Continuous wave magnetrons,Type CK-141SJ 1547-791980-6-1
Pulsed magnetrons,Type CKM-120SJ 1545-791980-6-1
Continuous wave magnetrons,Type CK-141SJ 1547-19791980-6-1
Method for spectral analysis of Nickel- Tungsten-Magnesium alloySJ/Z 1544-791980-6-1
Method for spectral analysis of Nickel- Tungsten-Magnesium alloySJ/Z 1544-19791980-6-1
Method of life test for low power electronic tubesSJ 26-791980-6-1
Pulsed magnetrons,Type CKM-120SJ 1545-19791980-6-1
Silicon epitaxial wafers (Provisional)SJ 1549-19791980-6-1
Continuous wave magnetrons,Type CK-140BSJ 1546-791980-6-1
Method of life test for low power electronic tubesSJ 26-19791980-6-1
Silicon epitaxial wafers (Provisional)SJ 1549-791980-6-1
~SJ 1532-19791979-12-1
Transmitting tubes,Type FU-433SSJ 1533-19791979-12-1
~SJ 1532-791979-12-1
Contact diameter series for leading ring of ceramic-metal electronic tubesSJ 1531-19791979-12-1
Transmitting tubes,Type FU-433SSJ 1533-791979-12-1
Contact diameter series for leading ring of ceramic-metal electronic tubesSJ 1531-791979-12-1
Method of chemical analysis of ceramic blankSJ/Z 1465-791979-11-27
Method of chemical analysis of raw materials for use in chemical engineeringSJ/Z 1466-19791979-11-27
Method of chemical analysis of raw materials for use in chemical engineeringSJ/Z 1466-791979-11-27
General requirements for chemical analysis of electronic ceramic materialsSJ/Z 1463-791979-11-27
Method of chemical analysis of ore materialsSJ/Z 1464-791979-11-27
Method of chemical analysis of ore materialsSJ/Z 1464-19791979-11-27
General requirements for chemical analysis of electronic ceramic materialsSJ/Z 1463-19791979-11-27
Method of chemical analysis of ceramic blankSJ/Z 1465-19791979-11-27
Methods of measurement for filament current and filament voltage of noise-generator diodesSJ 1387-19781979-7-1
Pulsed magnetron,Type CKM-114BSJ 1439-781979-7-1
Electronic tubes,Type FU-822Z(F)SJ 1382-781979-7-1
Pulsed magnetron, Type CKM-104BSJ 1437-19781979-7-1
Methods of measurement for nonliearity factor of excess noise power of noise-generator diodesSJ 1390-781979-7-1
Methods of measurement for anode conductance of noise-generator diodesSJ 1388-19781979-7-1
Methods of measurement for excess noise power of noise-generator diodesSJ 1392-781979-7-1
Structure and technology of test diodeSJ 1381-19781979-7-1
Methods of measurement for cathode preheating time of gas discharge noise tubesSJ 1393-19781979-7-1
Methods of measurement for nonliearity factor of excess noise power of noise-generator diodesSJ 1390-19781979-7-1
Electronic tubes,Type FU-104Z(F)SJ 1383-19781979-7-1
Methods of measurement for firing voltage of gas discharge noise tubesSJ 1394-19781979-7-1
Methods of measurement for voltage standing wave ratio on cold conditions of noise-generator diodesSJ 1391-19781979-7-1
Methods of measurement for anode current and tube voltage drop of gas discharge noise tubesSJ 1395-781979-7-1
Electronic tubes,Type FU-822Z(F)SJ 1382-19781979-7-1
Pulsed magnetron, Type CKM-104SJ 1436-19781979-7-1
Pulsed magnetron, Type CKM-114SJ 1438-19781979-7-1
Methods of measurement for voltage standing wave ratio of gas discharge noise tubesSJ 1396-781979-7-1
General specification for noise-generator diodes and gas discharge noise tubesSJ 1385-19781979-7-1
General specification for noise-generator diodes and gas discharge noise tubesSJ 1385-781979-7-1
Measurement conditions for noise-generator diodes and gas discharge noise tubesSJ 1386-781979-7-1
Methods of measurement for voltage standing wave ratio of gas discharge noise tubesSJ 1396-19781979-7-1
Electronic tubes,Type FU-104Z(F)SJ 1383-781979-7-1
Measurement conditions for noise-generator diodes and gas discharge noise tubesSJ 1386-19781979-7-1
Methods of measurement for cathode preheating time of gas discharge noise tubesSJ 1393-781979-7-1
Pulsed magnetron, Type CKM-104SJ 1436-781979-7-1
Methods of measurement for anode conductance of noise-generator diodesSJ 1388-781979-7-1
Pulsed magnetron,Type CKM-114BSJ 1439-19781979-7-1
Methods of measurement for anode current and tube voltage drop of gas discharge noise tubesSJ 1395-19781979-7-1
Methods of measurement for diodes leakage current between electrodes of noise-generator diodesSJ 1389-781979-7-1
Pulsed magnetron, Type CKM-104BSJ 1437-781979-7-1
Methods of measurement for excess noise power of noise-generator diodesSJ 1392-19781979-7-1
Methods of measurement for voltage standing wave ratio on cold conditions of noise-generator diodesSJ 1391-781979-7-1
Methods of measurement for filament current and filament voltage of noise-generator diodesSJ 1387-781979-7-1
Methods of measurement for decaying characteristic of gas discharge noise tubesSJ 1397-19781979-7-1
Methods of measurement for decaying characteristic of gas discharge noise tubesSJ 1397-781979-7-1
Methods of measurement for excess noise ratio and nonstationary characteristic of gas discharge noise tubesSJ 1398-781979-7-1
Methods of measurement for diodes leakage current between electrodes of noise-generator diodesSJ 1389-19781979-7-1
Methods of measurement for firing voltage of gas discharge noise tubesSJ 1394-781979-7-1
Pulsed magnetron, Type CKM-114SJ 1438-781979-7-1
Methods of measurement for excess noise ratio and nonstationary characteristic of gas discharge noise tubesSJ 1398-19781979-7-1
Structure and technology of test diodeSJ 1381-781979-7-1
Electronic tubes,Type FU-101F and F-101ZSJ 1287-19771978-6-1
Electronic tubes,Type FU-101F and F-101ZSJ 1287-771978-6-1
Phosphor Y12SJ 1168-771977-12-1
Phosphor Y6SJ 1165-771977-12-1
Phosphor Y12SJ 1168-19771977-12-1
Phosphor Y6SJ 1165-19771977-12-1
Electronic tubes,Type FU-105ZSJ 1286-19771977-10-1
Preferred series and types of fluorescent display tubesSJ/Z 1122-19761977-10-1
Preferred series and types of fluorescent display tubesSJ/Z 1122-761977-10-1
Electronic tubes,Type FU-105ZSJ 1286-771977-10-1
Low noise travelling wave tubes,Type B-101SJ 1143-771977-7-1
Low noise travelling wave tubes,Type B-101SJ 1143-19771977-7-1
Reflex klystrons,Type K-27SJ 1053-761977-1-1
Reflex klystrons,Type K-27SJ 1053-19761977-1-1
Pulsed magnetrons,Type CKM-30SJ 1055-761977-1-1
About Us Contact Us Payment
Tel: +86-10-8572 5655 | Fax: +86-10-8581 9515 Email: coc@codeofchina.com | Send me a messageQQ: 672269886
Copyright: Codeofchina Inc 2008-2020