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Title Standard No. Implemented On
Measurement of quartz crystal unit parameters—Part 11:Standard method for the determination of the load resonance frequency fL and the effective load capacitance C Leff using automatic network analyzer techniques and error correctionGB/T 22319.11-2018
Measurement of quartz crystal unit parameters—Part 9:Measurement of spurious resonances of piezoelectric crystal unitsGB/T 22319.9-20182018-10-1
Quartz crystal units of assessed quality-Part 1:Generic specificationGB/T 12273.1-20172017-12-1
Synthetic quartz crystal wafer for optical low pass filter(OLPF)GB/T 32988-20162017-9-1
Generic specification for piezoelectric ceramic transducing elementsGB/T 15156-20152016-2-1
Measurement of quartz crystal unit parameters―Part 7:Measurement of activity dips of quartz crystal unitsGB/T 22319.7-20152016-2-1
Single Crystal Wafers for Surface Acoustic Wave (SAW) Device Applications - Specifications and Measuring MethodsGB/T 30118-20132014-5-15
Langasite piezoelectric crystalJC/T 2148-20122013-6-1
Determination of doped and trace elements in barium strontium titanate(BST)—Inductively coupled plasma atomic emission spectrometric methodJC/T 2132-20122013-6-1
Test method for extinction ratio of optical crystalGB/T 11297.12-20122013-6-1
Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specificationGB/T 12274.1-20122013-2-15
Designations for piezoelectric crystalsGB/T 9532-20122013-2-15
Piezoelectric ceramic resonators - A specification in the IEC quality assessment System for electronic components(IECQ) - Part 1: Generic specification-Qualification approvalGB/T 12859.1-20122013-2-15
Synthetic quartz crystal - Specifications and guide to the useGB/T 3352-20122013-2-15
Piezoelectric ceramic resonators - A specification in the IEC quality assessment System for electronic components (IECQ) - Part 2: Sectional specification-Qualification approvalGB/T 12859.2-20122013-2-15
Quartz crystal units A specification in the quality assessment system for electronic components Part 5.1: Blank detail specification- qualification approvalGB/T 12273.501-20122013-2-15
Piezoelectric ceramic resonators - A specification in the quality assessment System for electronic components - Part 2-1: Blank detail specification-Assessment level EGB/T 12859.201-20122013-2-15
Surface acoustic wave(SAW) filters of assessed quality - Part 1: Generic specification GB/T 27700.1-20112012-5-1
Surface acoustic wave(SAW) filters of assessed quality—Part 2:Guidance on useGB/T 27700.2-20112012-5-1
Lead magnesium niobate titanate (PMNT) piezoelectric single crystalsJC/T 2025-20102011-3-1
Piezoelectric filters of assessed quality - Part 1: Generic sepcificationGB/T 22317.1-20082009-1-1
Surface acoustic wave(SAW)resonators - Part 1-1: General information and standard valuesGB/T 22318.1-20082009-1-1
Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal unitsGB/T 22319.8-20082009-1-1
Surface acoustic wave(SAW)resonators - Part 1-2: Test conditionsGB/T 22318.2-20082009-1-1
Lithium niobate single crystalsYS/T 554-20062006-10-11
Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification-Qualification approvalSJ/T 11257-20012002-5-1
Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specificationSJ/T 11256-20012002-5-1
Quartz crystal controlled oscillators of assessed quality - Part 5-1: Blank detail specification Qualification approvalSJ/T 11258-20012002-5-1
Measurement of quartz crystal unit parameters Part 6: Measurement of drive level dependence (DLD)SJ/T 11212-19991999-12-1
Measurement of quartz crystal unit parameters Part 4: Method for the measurement of the load resonance frequency fl, load resonance resistance Rl and the calculation of other derived vSJ/T 11210-19991999-12-1
Measurement of quartz crystal unit parameters Part 5: Method for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correctionSJ/T 11211-19991999-12-1
Detailed Specifications of XJ 33 Quartz Crystal Component QJ 2979-19971997-10-17
Quartz crystal units-A specification in the Quality Assessment System for Electronic Components Part 3: Sectional specification - Qualification approvalGB/T 16517-19961997-5-1
Quartz crystal units-A specification in the Quality Assessment system for Electronic Components - Part 1: Generic specificationGB/T 12273-19961997-5-1
Quartz crystal units-A specification in the Quality Assessment System for Electronic Components Part 2: Sectional specification—Capability approvalGB/T 16516-19961996-5-1
Generic specification for piezoelectric ceramic transducing elementsGB/T 15156-19941995-2-1
The rule of type designation for quarz crystal oscillatorsGB 12275-19901990-10-1
Quartz orystal controlled oscillators-Generic specificationGB 12274-19901990-10-1
The rule of type designation for quarz crystal oscillatorsGB/T 12275-19901990-10-1
Designations for LiNbO3,LiTaO3,Bi12GeO20,Bi12SiO20 piezoelectric crystalsGB 9532-19881989-2-1
Holders (Enclosures), crystal, general specification forGB 8553-19871988-6-1
The rule of type designation for quartz crystal unitsGB 6429-19861987-5-1
Detail specification for electronic components--Bipolar transistors for ambient-rated low and high frequency amplification types 3DG201CGB 5820.3-19861986-9-1
Detail specification for electronic components--Bipolar transistors for switching amplification types 3DK106A, 3DK106BGB 5821.1-19861986-9-1
Detail specification for electronic components--Bipolar transistors for ambient-rated low and high frequency amplification types 3DG111B, 3DG111C, 3DG111E, 3DG111FGB 5820.2-19861986-9-1
Detail specification for electronic components--Bipolar transistors for ambient-rated low and high frequency amplification of types 3DG130A, SDG130B, 3DG130C, 3DG 130DGB 5820.1-19861986-9-1
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