2026-2-12 10.1.71.44
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Chinese National Standard List: Semiconductor discrete devices in general

GB/T 4937.39-2025 Semiconductor devices—Mechanical and climatic test methods—Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components 
  Issued on: 2025-12-31   Translation Price(USD): 315.0
GB/T 4937.40-2025 Semiconductor devices—Mechanical and climatic test methods—Part 40: Board level drop test method using a strain gauge 
  Issued on: 2025-12-31   Translation Price(USD): 375.0
GB/T 4937.44-2025 Semiconductor devices—Mechanical and climatic test methods—Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices 
  Issued on: 2025-12-2   Translation Price(USD): 255.0
GB/T 4937.33-2025 Semiconductor devices—Mechanical and climatic test methods—Part 33: Accelerated moisture resistance—Unbiased autoclave 
  Issued on: 2025-12-2   Translation Price(USD): 165.0
GB/T 4937.38-2025 Semiconductor devices—Mechanical and climatic test methods—Part 38: Soft error test method for semiconductor devices with memory 
  Issued on: 2025-12-2   Translation Price(USD): 225.0
GB/T 4937.36-2025 Semiconductor devices—Mechanical and climatic test methods—Part 36:Acceleration，steady state 
  Issued on: 2025-12-2   Translation Price(USD): 165.0
GB/T 4937.16-2025 Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection(PIND) 
  Issued on: 2025-10-31   Translation Price(USD): 270.0
GB/T 46567.1-2025 Intelligent computing - Test method for memristor - Part 1: Basic characteristics 
  Issued on: 2025-10-31   Translation Price(USD): 240.0
GB/T 45722-2025 Semiconductor devices—Constant current electromigration test 
  Issued on: 2025-05-30   Translation Price(USD): 270.0
GB/T 45721.1-2025 Semiconductor devices—Stress migration test—Part 1: Copper stress migration test 
  Issued on: 2025-05-30   Translation Price(USD): 435.0
GB/T 45718-2025 Semiconductor devices—Time dependent dielectric breakdown (TDDB) test for inter-metal layers 
  Issued on: 2025-05-30   Translation Price(USD): 315.0
GB/T 45719-2025 Semiconductor devices—Hot carrier test on metal-oxide semiconductor(MOS) transistors 
  Issued on: 2025-05-30   Translation Price(USD): 270.0
GB/T 45716-2025 Semiconductor devices—Bias temperature instability test for metal-oxide semiconductor field-effect transistors (MOSFETs) 
  Issued on: 2025-05-30   Translation Price(USD): 270.0
DB32/T 4894-2024 Test method for performance of micro-electromechanical systems semiconductor gas sensor 
  Issued on: 2024-11-07   Translation Price(USD):
GB/T 4937.35-2024 Semiconductor devices—Mechanical and climatic test methods—Part 35: Acoustic microscopy for plastic encapsulated electronic components 
  Issued on: 2024-3-15   Translation Price(USD): 330.0
GB/T 4937.34-2024 Semiconductor devices—Mechanical and climatic test methods—Part 34:Power cycling 
  Issued on: 2024-3-15   Translation Price(USD): 210.0
GB/T 4587-2023 Semiconductor devices—Discrete devices—Part 7:Bipolar transistors 
  Issued on: 2023-9-7   Translation Price(USD): 1275.0
GB/T 4937.26-2023 Semiconductor devices—Mechanical and climatic test methods—Part 26: Electrostatic discharge (ESD) sensitivity testing—Human body model（HBM） 
  Issued on: 2023-9-7   Translation Price(USD): 800.0
GB/T 42709.19-2023 Semiconductor devices―Micro-electromechanical devices―Part 19:Electronic compasses 
  Issued on: 2023-08-06   Translation Price(USD): 435.0
GB/T 4937.27-2023 Semiconductor devices—Mechanical and climatic test methods—Part 27: Electrostatic discharge(ESD) sensitivity testing—Machine model(MM)  
  Issued on: 2023-05-23   Translation Price(USD): 255.0
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