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| Chinese National Standard List: Microwave and millimeter wave diode and triode |
| Title | Standard No. | Implemented On |
| Probe test method for light emitting diode chips | GB/T 36613-2018 | 2019-1-1 |
| Point estimation and interval estimation for reliability testing of LED applied products(exponential distribution) | GB/T 36362-2018 | 2019-1-1 |
| Series program for semiconductor light emitting diodes | SJ/T 11401-2009 | 2010-1-1 |
| Measurement methods for chips of light emitting diodes | SJ/T 11399-2009 | 2010-1-1 |
| Technical specification for power light-emitting diode chips | SJ/T 11398-2009 | 2010-1-1 |
| Semiconductor optoelectronic devices - Blank detail specification for power light-emitting diodes | SJ/T 11393-2009 | 2010-1-1 |
| Blank detail specification for LED numeric displays | GB/T 15529-1995 | 1995-1-1 |
| Blank detail specification for light emitting diodes | GB/T 12561-1990 | 1991-10-1 |
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