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Title Standard No. Implemented On
Semiconductor integrated circuit—Measuring methods for flash memoryGB/T 36477-20182019-1-1
Semiconductor integrated circuit—Measuring methods for double data rate 3 synchronous dynamic random access memory(DDR3 SDRAM)GB/T 36474-20182019-1-1
Specification for serial NOR flash interfaceGB/T 35008-20182018-8-1
Semiconductor integrated circuits—Measuring method of level converterGB/T 35006-20182018-8-1
Semiconductor integrated circuits—Measuring method of low voltage differential signaling circuitryGB/T 35007-20182018-8-1
Logic digital integrated circuits—Specification for I/O interface model for integrated circuitGB/T 35004-20182018-8-1
Specification for serial NAND flash interfaceGB/T 35009-20182018-8-1
Semiconductor integrated circuits—Measuring method of analogue switchGB/T 14028-20182018-8-1
Test methods for endurance and data retention of non-volatile memoryGB/T 35003-20182018-8-1
Semiconductor integrated circuits—Measuring method of voltage regulatorsGB/T 4377-20182018-8-1
Nanotechnologies―Electrical operating parameter test specification of wafer level nano-scale phase change memory cellsGB/T 33657-20172017-12-1
Semiconductor integrated circuits―Specification for stamped leadframes of plastic DIPGB/T 14112-20152016-1-1
Semiconductor integrated circuits―Specification of leadframes for plastic quad flat packageGB/T 15876-20152016-1-1
Semiconductor integrated circuits―Specification of leadframes for small outline packageGB/T 15878-20152016-1-1
Semiconductor integrated circuits―Specification of leadframes for plastic leaded chip carrier packageGB/T 16525-20152016-1-1
Examination methods for similarity comparison of integrated circuit chipsGA/T 1171-20142014-7-9
Semiconductor devices - Integrated circuits - Part 2-11: Digital integrated circuits - Blank detail specification for single supply integrated circuit electrically erasable and programmable read-only memoryGB/T 17574.11-20062007-5-1
Semiconductor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuitsGB/T 17574.20-20062007-5-1
Semiconductor devices - Integrated circuits - Part 2-9: Digital integrated circuits - Blank detail specification for MOS ultraviolet light erasable electrically programmable read-onlGB/T 17574.9-20062007-5-1
Semiconductor devices―Integrated circuits―Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuitsGB/T 12750-20062007-2-1
Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits GB/T 20515-20062007-2-1
Semiconductor integrated circuits detail specification for types JF124 and JF124A quad operational amplifiersSJ 50597/63-20062006-12-30
Semiconductor integrated circuits detail specification for types JF 1558 and JF 1558A general dual operational amplifiersSJ 50597/62-20062006-12-30
Integrated circuit IP core transfer specificationSJ/Z 11353-20062006-12-1
On - Chip bus attributes specificationSJ/Z 11356-20062006-12-1
Integrated circuit IP core attributes with formats for profiling selection and transfer standardSJ/Z 11351-20062006-12-1
Specification for integrated circuit IP/SoC functional verificationSJ/Z 11355-20062006-12-1
Integrated circuit IP core signal integrity specificationSJ/Z 11360-20062006-12-1
Integrated circuit soft and hard IP core structural performance and physica Imodeling specificationSJ/Z 11357-20062006-12-1
Integrated circuit intellectual property core protection:schemes alternatives and discussionSJ/Z 11361-20062006-12-1
Taxonomy of functional verification for integrated circuit IP core development and integrationSJ/Z 11359-20062006-12-1
Integrated circuit analog/mixed-signal IP core specificationSJ/Z 11354-20062006-12-1
Integrated circuit IP core test data interchange formats and guidelines specificationSJ/Z 11352-20062006-12-1
Integrated circuit IP core model taxonomySJ/Z 11358-20062006-12-1
Semiconductor integrated circuits detail specification for types JW1083/JW1084/JW1085/JW1086 three terminal adjustable low dropout positive voltage regulatorsSJ 50597/61-20052006-6-1
Semiconductor integrated circuits Detail specification for types JW117/JW150/JW138 three terminal adjustable positive voltage referenceSJ 50597/60-20042004-12-1
Semiconductor devices—Integrated Circuits—Part 11:Section 1:Internal visual examination for semiconductor integrated circuits (excluding hybrid circuits)GB/T 19403.1-20032004-8-1
Semiconductor devices—Integrated circuits—Part 2-10:Digital integrated circuits—Blank detail specification of integrated circuit dynamic read/write memoriesGB/T 17574.10-20032004-8-1
Detail specification of ceramic PGA for semiconductor integrated circuitsSJ 51420/3-20032003-12-1
Semiconductor integrated circuits Detail specification for type JB523 wide-band Logarithmic amplifierSJ 50597/59-20032003-12-1
Semconductor integrated circuits - Detail specification for type JW584/JW584A progammable voltage referenceSJ 50597/57-20032003-12-1
Semiconductor integrated circuits Detail specification for type JB726 limit Amplifier discriminatorSJ 50597/58-20032003-12-1
Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits - Section 1: Bland detail specification for linear digital - To-analogue converters (DAC)GB/T 18500.1-20012002-6-1
Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits - Section 2: Blank detail specification for linear analogue - To - Digital converters(ADC)GB/T 18500.2-20012002-6-1
Semiconductor integrated circuits - Detail specification for JW431 prefision adjustable voltage referenceSJ 50597/54-20022002-5-1
Semiconductor integrated circuits - Detail specification for type JW920 PIN driverSJ 50597/56-20022002-5-1
Semiconductor integrated circuits - Detail specification for JSC320C25 digital signal processorSJ 50597/55-20022002-5-1
Semiconductor devices--Integrated circuits--Part 3:Analogue integrated circuitsGB/T 17940-20002000-8-1
Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section one - Blank detail specification for bipolar monolithic digital integrated circuit gates (excGB/T 5965-20002000-7-1
CD Metrology proceduresGB/T 17864-19992000-6-1
Guideline for programmed defect masks and benchmark procedures for sensitivity analysis of mask defect inspection systemsGB/T 17866-19992000-6-1
Specification for measuring depth of focus and best focusGB/T 17865-19992000-6-1
Detailed Specifications for Semiconductor Integrated Circuit HCT or Gate or Not GateQJ 3091-19991999-9-15
Detailed Specifications for Semiconductor Integrated Circuit HCT or Gate or Not GateQJ 3092-19991999-9-15
Semiconductor devices--Integrated circuits Part 2:Digital integrated circuits Section four--Family specification for complementary MOS digital integrated circuits,series 4 000B and 4 000UBGB/T 17572-19981999-6-1
Semiconductor devices --Integrated circuits --Part 2:Digital integrated circuits --Section five --Blank detail specification for complementary MOS digital integrated circuits,series 4 0GB/T 9424-19981999-6-1
Semiconductor integrated circuits-General principles of measuring methods of voltage regulatorGB/T 4377-19961997-1-1
Semiconductor integrated circuits-General principles of measuring methods of voltage comparatorsGB/T 6798-19961997-1-1
Series and products of high frequency wideband amplifiers for hybrid integrated circuits used in cabled distribution systemsGB/T 15295-19941995-7-1
Series and products of voltage regulators for semiconductor integrated circuitsGB/T 4376-19941995-4-1
principles of measuring methods of Sample/Hold amplifiers for semiconductor integrated circuitsGB/T 14115-19931993-8-1
Series and products of communication circuits for semiconductor integrated circuitsGB/T 14027.1-19921993-8-1
principles of measuring methods of V/F and F/V converters for semiconductor integrated circuitsGB/T 14114-19931993-8-1
Detailed Specifications for Jμ8304 Programmable Timer/counter of Semiconductor Integrated CircuitSJ 20073-19921993-5-1
Detail specification for types JT54S151.JT54S153 and JT54S157 DATA SELECTORS/MULTIOLEXERS of S-TTL semiconductor integrated circuitsSJ 20158-19921993-5-1
Detail specification for types JT54LS32 and JT54LS86 OR GATES of LS-TTL semiconductor integrated circuitsSJ 20157-19921993-5-1
Detailed Specifications for JΜ8309 Programmable Interrupt Controller of Semiconductor Integrated CircuitSJ 20075-19921993-5-1
Detailed Specifications for JΜ8305 Programmable Peripheral Equipment Interface of Semiconductor Integrated CircuitSJ 20074-19921993-5-1
Detailed Specifications for Jμ82288 Bus Controller of Semiconductor Integrated CircuitSJ 20076-19921993-5-1
Semiconductor integrated circuit. Test method for digital circuit specially designed for electromechanical instrumentsJB/T 5580-19911992-7-1
Series and products for semiconductor integrated circuits--Products for use in numerical control machine toolGB/T 13069-19911992-3-1
Series and products for semiconductor integrated circuits--Products for use in copying machineGB/T 13064-19911992-3-1
Series and products for semiconductor integrated circuits--Products for use in transducer sensitive to magneticGB/T 13068-19911992-3-1
Series and products of nonlinear circuits for semiconductor integrated circuits--Products of sample/hold amplifiersGB/T 12844-19911991-1-2
Series and products of nonlinear circuits for semiconductor integrated circuits--Products of voltage/frequency and frequency/voltage convertersGB/T 12845-19911991-1-2
Series and products for TTL semiconductor integrated circuits!*Products of series 54/74HGB/T 3432.2-19891990-4-1
The rule of type designation for semiconductor integrated circuitsGB 3430-19891990-4-1
Detail specification for electronic component—Semiconductor integrated circuit—CD7698CP horizontal and vertical sweep curcuit and chroma processorGB 11494-19891990-3-1
Detail specification for electronic component--Semiconductor integrated circuit for TV-CD5132CP--Picture IF amplifierGB 9591-19881989-3-1
Detail specification for electronic component--Semiconductor integrated circuit for TV-CD5435CP horizontal and vertical sweep circuitGB 9590-19881989-3-1
Detail specification for electronic component--Semiconductor integrated circuit for TV-CD 5612 CP video signal chrominance signal processing circuitGB 9593-19881989-3-1
Detail specification for electronic component--Semiconductor integrated circuit for TV-CD5622CP PAL system chrominance signal processing circuitGB 9592-19881989-3-1
Detail specification for electronic component--Semiconductor integrated circuit for TV-CD5250CP sound IF amplifierGB/T 9589-19881989-3-1
Semiconductor integrated circuit--CC4518 CMOS dual BCD up-counterGB 9427-19881989-2-1
Detail specification for electronic component--Semiconductor integrated circuit-CF747 general dual operational amplifiersGB 9429-19881989-2-1
Semiconductor integrated circuit--CB14433 3 1/2 digits A/D ConverterGB 9611-19881989-2-1
General principles of measuring methods of horizontal and vertical sweep circuit for semiconductor TV integrated circuitsGB 9614-19881989-2-1
Detail specification for electronic component--Semiconductor integrated circuit for TV-CD11215ACP picture IF amplifierGB 9617-19881989-2-1
Detail specification for electronic components--Semiconductor microcomputer integrated circuits--Cμ6800 8-bit microprocessorGB 9422-19881989-2-1
Detail specification for electronic component--Semiconductor integrated circuit for TV-CD11235CP horizontal and vertical sweep circuitGB 9616-19881989-2-1
General principles of measuring methods of audio channel circuit for semiconductor TV integrated circuitsGB 9613-19881989-2-1
Blank detail specification for semiconductor integrated circuit operational amplifiersGB 9425-19881989-2-1
Detail specification for electronic component--Semiconductor integrated circuit for TV-CD1124ACP Sound IF amplifierGB 9618-19881989-2-1
General principles of measuring methods of picture channel circuit for semiconductor TV integrated circuitsGB 9612-19881989-2-1
Detail specification for electronic component--Semiconductor integrated circuit--CW7805 three-terminal positive voltage regulatorGB 9428-19881989-2-1
Series and products of semiconductor integrated circuit for microcomputer-Products of 68000 familyGB 7505-19871987-11-1
Detail specification for electronic components--Semiconductor integrated circuit-CDA7520 types 10 bit D/A converterGB 7510-19871987-11-1
Detail specification for electronic components--Semiconductor integrated circuit- CF741 operational amplifierGB 7498-19871987-11-1
Detail specification for electronic components--Semiconductor integrated circuit- CW723 Multiterminal adjustable voltage regulatorGB 7499-19871987-11-1
General principles of measuring methods of audio preamplifiers for semiconductor audio integrated circuitsGB 7500-19871987-11-1
detail specification for microprocessor semiconductor integrated circuitsGB 7509-19871987-11-1
Detail specification for electronic components--Semiconductor integrated circuit-CE10131 ECL dual type D master-slave flip-flopGB 7511-19871987-11-1
Series and products of semiconductor integrated circuit for microcomputer-Products of 8086 familyGB 7506-19871987-11-1
Detail specification for electronic component--Semiconductor integrated circuit--CJ0450 Dual peripheral positive AND driversGB 7085-19861987-10-1
Detail specification for electronic component--Semiconductor integrated circuit--CJ0454 Dual peripheral positive NOR driversGB 7089-19861987-10-1
Detail specification for electronic component--Semiconductor integrated circuit--CJ 0451 Dual peripheral positive AND driversGB 7086-19861987-10-1
Detail specification for electronic component--Semiconductor integrated circuit--CD7611 CP picture IF amplifierGB 7091-19861987-10-1
Detail specification for electronic component--Semiconductor integrated circuit--CH 2007 HTL Quad inverterGB 7080-19861987-10-1
Detail specification for electronic component--Semiconductor integrated circuit--CD7193 CP chroma processorGB 7090-19861987-10-1
Detail specification for electronic component--semiconductor integrated circuit--CJ0453 Dual peripheral positive OR driversGB 7088-19861987-10-1
Detail specification for electronic component--Semiconductor integrated circuit--CJ0452 Dual peripheral positive NAND driversGB 7087-19861987-10-1
Detail specification for electronic component--semiconductor integrated circuit-CT1054 TTL 4 Wide 2-2-2-2 input AND-OR-invert gateGB 7014-19861987-8-1
Detail specification for electronic component--Semiconductor integrated circuit-CT1004 TTL Hex inverterGB 7007-19861987-8-1
Detail specification for electronic component--Semiconductor integrated circuit-CT1010 TTL Triple 3 input NAND gateGB 7009-19861987-8-1
Detail specification for electronic component--Semiconductor integrated circuit-CT1008 TTL Quad 2 input AND gateGB 7008-19861987-8-1
Detail specification for electronic component--Semiconductor integrated circuit-CT1030 TTL 8 input NAND gateGB 7012-19861987-8-1
Generic specification of packages for semiconductor integrated circuitsGB 6649-19861987-8-1
Detail specification for electronic component--Semiconductor integrated circuit-CT1002 TTL Quad 2 input NOR gateGB 7006-19861987-8-1
Detail specification for electronic component--Semiconductor integrated circuit-CT1020 TTL Dual 4 input NAND gateGB 7010-19861987-8-1
General principles of measuring methods of D/A and A/D converters for semiconductor non-linear integrated circuitsGB 7015-19861987-8-1
Detail specification for electronic component--Semiconductor integrated circuit-CT1040 TTL Dual 4 input NAND bufferGB 7013-19861987-8-1
Detail specification for electronic component--Semiconductor integrated circuit-CT1000 TTL Quad 2 input NAND gateGB 7005-19861987-8-1
Detail specification for electronic component--Semiconductor integrated circuit-CT1027 TTL Triple 3 input NOR gateGB 7011-19861987-8-1
General principles of measuring methods of line circuits for semiconductor interface integrated circuitsGB 6796-19861987-7-1
General principles of measuring methods of audio power amplifiers for semiconductor audio integrated circuitsGB 6800-19861987-7-1
General principles of measuring methods of display drivers for semiconductor interface integrated circuitsGB 6799-19861987-7-1
General principles of measuring methods of voltage comparators for semiconductor interface integrated circuitsGB 6798-19861987-7-1
General principles of measuring methods of magnetic memory drivers for semiconductor interface integrated circuitsGB 6794-19861987-7-1
General principles of measuring methods of peripheral drivers for semiconductor interface integrated circuitsGB 6795-19861987-7-1
Letter symbols for semiconductor integrated circuits; Letter symbols for function of pinsGB 3431.2-19861987-4-1
Detail specification for electronic component--Semiconductor integrated circuit--CD7609CP horizontal and vertical sweep circuitGB 6305-19861986-12-1
Blank detail specification for semiconductor integrated circuit bipolar gatesGB 5965-19861986-9-1
Families and products of linear amplifier for semiconductor integrated circuitsGB 4855-19841985-10-1
General principles of measuring methods of HTL circuits for semiconductor integrated circuitsGB 3440-19821983-10-1
Letter symbols for semiconductor integrated circuits--Letter symbols for characteristicsGB 3431.1-19821983-10-1
Detail specifiction for types JC4049、JC4050 buffer/converters of CMOS semiconductor integrated circuitsSJ 50597.6-19941974-1-1
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