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Title Standard No. Implemented On
Nanotechnologies - Characterization of Single-Wall Carbon Nanotubes Using Transmission Electron MicroscopyGB/T 30543-20142014-11-1
X-ray diffractometerJB/T 11144-20112012-4-1
X-ray fluorescence spectrometerJB/T 11145-20112012-4-1
General rules for Auger electron spectroscopic analysisGB/T 26533-20112011-12-1
Specification of X-ray diffractometerJB/T 9400-20102010-7-1
Microbeam analysis - Scanning electron microscopy - VocabularyGB/T 23414-20092009-12-1
Laser guardsGB/T 18151-20082009-10-1
Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using calibration curve methodGB/T 15247-20082009-4-1
Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectorsGB/T 20726-20062007-8-1
General rules for nanometer-scale lengthmeasurement by SEMGB/T 20307-20062007-2-1
Surface chemical analysis-Secondary-ion mass spectrometry-Determination of boron atomic concentration in silicon using uniformly doped materialsGB/T 20176-20062006-11-1
Surface chemical analysis-Sputter depth profiling-Optimization using layered systems as reference materialsGB/T 20175-20062006-11-1
Toolmakers microscopeJB/T 10573-20062006-10-1
General rules for X-ray photoelectron spectroscopic analysis methodGB/T 19500-20042004-12-1
The specification for X-ray Crystal Orientation apparatusJB/T 5482-20042004-11-1
The dose of X-rays leakage from electron microscopeGB 7667-20032004-5-1
Quantitative analysis of rare earth element(REE) oxides by electron probe microanalysis(EPMA)GB/T 15245-20022003-6-1
General specification of transmission electron microscope(TEM)-X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimensGB/T 18873-20022003-6-1
Quantitative analysis of silicate minerals by electron probe microanalysisGB/T 15617-20022003-6-1
Quantitative analysis of sulfide minerals by electron probe microanalysisGB/T 15246-20022003-6-1
General specification of nanometer thin STANDARD specimen for analytical transmission electron microscopy (AEM/EDS)GB/T 18735-20022002-12-1
Safety of laser products--Part 1:Equipment classification,requirements and users guideGB 7247.1-20012002-5-1
Laser guardsGB 18151-20002000-1-2
Visible spectrophotometerJB/T 9324-19992000-1-1
Specification for diffraction gratingJB/T 8239.2-19992000-1-1
Whiteness meterJB/T 9327-19992000-1-1
Laser Raman spectrophotometerJB/T 9326-19992000-1-1
Basic parameters for diffraction gratingJB/T 8239.1-19992000-1-1
General specification of thin biological STANDARDs for X-ray EDS microanalysis in electron microscopeGB/T 17507-19981999-7-1
The method of electron probe microanalysis as corrosive layer on ferrous metals of shipGB/T 17506-19981999-7-1
Surface composition analysis method of gold-plated products by EDXGB/T 17723-19991999-1-2
Gold-plated thickness measurement by SEMGB/T 17722-19991999-1-2
Method of quantitative electron probe microanalysis on gold productsGB/T 17363-19981998-1-2
Method of quantitative electron probe microanalysis on low contents of Si and Mn in steelsGB/T 17360-19981998-1-2
Non-damage quantitative analysis of gold content in gold productsGB/T 17364-19981998-1-2
General rules for fourier transform infrared spectrometerJY/T 001-19961997-4-1
General rules for transmission electron microscopyJY/T 011-19961997-4-1
General rules for metallographic microscopyJY/T 012-19961997-4-1
Micron grade lenght measurement by SEMGB/T 16594-19961997-4-1
The dose of X-rays leakage from electron microscopeGB 7667-19961996-12-1
Qantitative method for electron probe microanalysis of metals and alloysGB/T 15616-19951996-2-1
Qantitative analysis method for silicate minerals by EPMAGB/T 15617-19951996-2-1
Specification for laser radiation power and energy measuring equipmentGB/T 6360-19951996-1-1
Standard method for electron probe microanalysis of sulfide mineralsGB/T 15246-19941995-6-1
Electron probe quantitative analysis method of carbon in carbon steel and low alloy steelļ¼¨Sensitivity curve method (detection limit method)GB/T 15247-19941995-6-1
Standard method for quantitative electorn probe microanalysis of ree oxidesGB/T 15245-19941995-6-1
General guide for EPMA quantitative analysisGB/T 15074-19941994-1-2
Test Method of Scanning Electron MicroscopeJB/T 6842-19931994-1-1
Terminology of Electronic Optical InstrumentJB/T 6841-19931994-1-1
UV/VIS Near Infrared SpectrophotometerJB/T 6778-19931994-1-1
Infrared SpectrophotometerJB/T 6779-19931994-1-1
UV/VIS SpectrophotometerJB/T 6777-19931994-1-1
Optical Transfer Function - Application - Lenses for Office CopiersJB/T 6784-19931994-1-1
Atomic Absorption SpectrophotometerJB/T 6780-19931994-1-1
Optical transer functionļ¼¨accuracy of measurementGB/T 13742-19921993-8-1
Melting Point Determination ApparatusJB/T 6177-19921993-1-1
Basic Parameter of Photographic Plate Cassette and Cassette Frame for SpectrographJB/T 6176-19921993-1-1
Test Method of Transmission Electron Microscope ResolutionJB/T 5585-19911992-7-1
Optical Transfer Function for MicroscopeJB/T 5521-19911992-7-1
Optical Transfer Function Application - 35 mm Camera Interchangeable LensJB/T 5522-19911992-7-1
Specification for Transmission Electron MicroscopeJB/T 5383-19911992-7-1
Diaphragm of Electron MicroscopeJB/T 5480-19911992-7-1
Fluorescence SpectrophotometerJB/T 5594-19911992-7-1
PolarimeterJB/T 5593-19911992-7-1
ColorimeterJB/T 5595-19911992-7-1
Optical Filter of Optical Spectrum InstrumentJB/T 5590-19911992-7-1
Lamp Filament of Electron MicroscopeJB/T 5481-19911992-7-1
Classification and Basic Parameter of Transmission Electron MicroscopeJB/T 5586-19911992-7-1
V-Prism refractometerJB/T 5592-19911992-7-1
Test Method of Transmission Electron Microscope AmplificationJB/T 5584-19911992-7-1
Scanning Electron Microscope - Technical SpecificationJB/T 5384-19911992-7-1
SaccharometerJB/T 5476-19911992-7-1
MicrophotometerJB/T 5596-19911992-7-1
Manual Scanning Photoelectric Direct-reading SpectrometerJB/T 5478-19911992-7-1
Toolmakers microscopeGB/T 3719-19881989-1-1
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