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Standard No. Title Price(USD) Delivery Status Add to Cart
GB/T 4937.18-2018 Semiconductor devices—Mechanical and climatic test methods—Part 18:Ionizing radiation(total dose) $130.00 via email in 1~3 business day valid
GB/T 4937.19-2018 Semiconductor devices—Mechanical and climatic test methods—Part 19:Die shear strength $80.00 via email in 1~3 business day valid
GB/T 4937.2-2006 Semiconductor devices - Mechanical and climatic test methods - Part 2 : Low air pressure $75.00 via email in 1~3 business day superseded
GB/T 4937.20-2018 Semiconductor devices—Mechanical and climatic test methods—Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat $310.00 via email in 1~5 business day valid
GB/T 4937.201-2018 Semiconductor devices—Mechanical and climatic test methods—Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat $430.00 via email in 1~5 business day valid
GB/T 4937.21-2018 Semiconductor devices—Mechanical and climatic test methods—Part 21: Solderability $250.00 via email in 1~3 business day valid
GB/T 4937.22-2018 Semiconductor devices—Mechanical and climatic test methods—Part 22:Bond strength $250.00 via email in 1~3 business day valid
GB/T 4937.23-2023 Semiconductor devices—Mechanical and climatic test methods—Part 23:High temperature operating life $255.00 via email in 1~3 business day valid
GB/T 4937.26-2023 Semiconductor devices—Mechanical and climatic test methods—Part 26: Electrostatic discharge (ESD) sensitivity testing—Human body model（HBM） $800.00 via email in 1~5 business day valid
GB/T 4937.27-2023 Semiconductor devices—Mechanical and climatic test methods—Part 27: Electrostatic discharge(ESD) sensitivity testing—Machine model(MM) $255.00 via email in 1~3 business day valid
GB/T 4937.3-2012 Semiconductor devices - Mechanical and climatic tests methods - Part 3: External visual examination $90.00 via email in 1~3 business day valid
GB/T 4937.30-2018 Semiconductor devices—Mechanical and climatic test methods—Part 30:Preconditioning of non-hermetic surface mount devices prior to reliability testing $130.00 via email in 1~3 business day valid
GB/T 4937.31-2023 Semiconductor devices—Mechanical and climatic test methods—Part 31:Flammability of platic-encapsulated devices（internally induced） $120.00 via email in 1~3 business day valid
GB/T 4937.32-2023 Semiconductor devices—Mechanical and climatic test methods—Part 32:Flammability of platic-encapsulated devices（externally induced） $120.00 via email in 1~3 business day valid
GB/T 4937.34-2024 Semiconductor devices—Mechanical and climatic test methods—Part 34:Power cycling $210.00 via email in 1~3 business day valid
GB/T 4937.35-2024 Semiconductor devices—Mechanical and climatic test methods—Part 35: Acoustic microscopy for plastic encapsulated electronic components $330.00 via email in 1~3 business day valid
GB/T 4937.4-2012 Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) $120.00 via email in 1~3 business day valid
GB/T 4937.42-2023 Semiconductor devices—Mechanical and climatic test methods—Part 42:Temperature and humidity storage $180.00 via email in 1~3 business day valid
SJ 50033/154-2002 Semiconductor discrete devices Detail specification for type 3DG251 silicon UHF low-noise transistor $120.00 via email in 1~3 business day valid
SJ 50033/155-2002 Semiconductor discrete devices Detail specification for type 3DG252 sillcon microwave linearity transistor $260.00 via email in 1~3 business day valid
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