2025-12-21 10.8.118.215
Code of China Chinese Standard Classification Professional Classification ICS Classification Latest
Position: Search valid to be valid superseded to be superseded abolished to be abolished
Standard No. Title Price(USD) Delivery Status Add to Cart
JJG 2069-2005 Verification Scheme of Measuring Instruments for Specular Gloss 90.0 via email in 1~3 business day valid,,2005-6-3
JB/T 9315-1999 Geodetic instuments-Levelling staffs 244.0 via email in 1~3 business day valid,,2000-1-1
GB/T 15240-1994 Measurement methods for exterior lighting 270.0 via email in 1~3 business day superseded2009-01-01,2009-1-1,1995-6-1
JB/T 8226.2-1999 Coating for optical element double layeranti - reflecting coating by hydrolltic process 130.0 via email in 1~3 business day valid,,2000-1-1
GB 12085.12-1989 Optics and optical instruments-Environmental test methods-Contamination 135.0 via email in 1~3 business day superseded2011-05-01,2011-5-1,1990-8-1
GB/T 6322-1986 Types and dimensions of plain limit gauges 300.0 via email in 1~5 business day superseded2009-05-01 ,2009-5-1,1987-1-1
GB/T 30543-2014 Nanotechnologies - Characterization of Single-Wall Carbon Nanotubes Using Transmission Electron Microscopy 540.0 via email in 1~3 business day valid,,2014-11-1
GB/T 17749-1999 Methods of whiteness specification 100.0 via email in 1~3 business day abolished2008-10-01,2008-10-1,1999-1-2
JB/T 9330-1999 The basic parameter for diaphragm plate of optical instrument 220.0 via email in 1~3 business day abolished2010-01-20 ,,2000-1-1
JB/T 9346-1999 Basic parameters for spectrophotometer 60.0 via email in 1~3 business day valid,,2000-1-1
GB/T 28197-2011 Methods for characterising tristimulus colorimeters for measuring the colour of light 270.0 via email in 1~3 business day valid,,2012-9-1
GB/T 13170.3-1991 Test charts of reflection for television. linear test chart B 220.0 via email in 1~3 business day superseded,2012-7-1,1992-5-1
GB/T 4930-1993 General specification of electron probe microanalysis STANDARD specimen 130.0 via email in 1~3 business day superseded,2008-10-1,1994-7-1
JB/T 9341.3-1999 Metrology grating technology -- Technical requiremnts for grating bar of galss 244.0 via email in 1~3 business day valid,,2000-1-1
GB/Z 21738-2008 Fundamental structures of one dimensional nanomaterials - High resolution electron microscopy characterization 120.0 via email in 1~3 business day valid,,2008-11-1
JB/T 9459-1999 Specifications for the jordan sunshine recorder 60.0 via email in 1~3 business day superseded,2016-3-1,2000-1-1
GB 12526-1990 Specification for long range electro-optical distance measurement 390.0 via email in 1~3 business day valid,,1991-8-1
GB/T 15246-1994 Standard method for electron probe microanalysis of sulfide minerals 184.0 via email in 1~3 business day superseded2003-06-01,2003-6-1,1995-6-1
GB/T 3718-1988 Universal horizontal metroscope 130.0 via email in 1~3 business day superseded2007-09-29,2006-10-11,1989-1-1
GB/T 13170.12-1991 Test charts of reflection for television. Radiation stripe test chart 180.0 via email in 1~3 business day superseded,2012-7-1,1992-5-1
Previous Page     Next Page



Code of China
Search

JJG 2069-2005 Verification Scheme of Measuring Instruments for Specular Gloss 
  Issued on: 2005-3-3   Price(USD): 90.0
JB/T 9315-1999 Geodetic instuments-Levelling staffs 
  Issued on: 1999-8-6   Price(USD): 244.0
GB/T 15240-1994 Measurement methods for exterior lighting 
  Issued on: 1994-10-17   Price(USD): 270.0
JB/T 8226.2-1999 Coating for optical element double layeranti - reflecting coating by hydrolltic process 
  Issued on: 1999-8-6   Price(USD): 130.0
GB 12085.12-1989 Optics and optical instruments-Environmental test methods-Contamination 
  Issued on: 1989-01-02   Price(USD): 135.0
GB/T 6322-1986 Types and dimensions of plain limit gauges 
  Issued on: 1986-04-24   Price(USD): 300.0
GB/T 30543-2014 Nanotechnologies - Characterization of Single-Wall Carbon Nanotubes Using Transmission Electron Microscopy 
  Issued on: 2014-5-6   Price(USD): 540.0
GB/T 17749-1999 Methods of whiteness specification 
  Issued on: 1999-05-01   Price(USD): 100.0
JB/T 9330-1999 The basic parameter for diaphragm plate of optical instrument 
  Issued on: 1999-08-06   Price(USD): 220.0
JB/T 9346-1999 Basic parameters for spectrophotometer 
  Issued on: 1999-8-6   Price(USD): 60.0
GB/T 28197-2011 Methods for characterising tristimulus colorimeters for measuring the colour of light 
  Issued on: 2011-12-30   Price(USD): 270.0
GB/T 13170.3-1991 Test charts of reflection for television. linear test chart B 
  Issued on: 1991-09-04   Price(USD): 220.0
GB/T 4930-1993 General specification of electron probe microanalysis STANDARD specimen 
  Issued on: 1993-08-30   Price(USD): 130.0
JB/T 9341.3-1999 Metrology grating technology -- Technical requiremnts for grating bar of galss 
  Issued on: 1999-8-6   Price(USD): 244.0
GB/Z 21738-2008 Fundamental structures of one dimensional nanomaterials - High resolution electron microscopy characterization 
  Issued on: 2008-5-8   Price(USD): 120.0
JB/T 9459-1999 Specifications for the jordan sunshine recorder 
  Issued on: 1999-8-6   Price(USD): 60.0
GB 12526-1990 Specification for long range electro-optical distance measurement 
  Issued on: 1990-12-6   Price(USD): 390.0
GB/T 15246-1994 Standard method for electron probe microanalysis of sulfide minerals 
  Issued on: 1994-09-26   Price(USD): 184.0
GB/T 3718-1988 Universal horizontal metroscope 
  Issued on: 1988-01-13   Price(USD): 130.0
GB/T 13170.12-1991 Test charts of reflection for television. Radiation stripe test chart 
  Issued on: 1991-09-04   Price(USD): 180.0
About Us   |    Contact Us   |    Terms of Service   |    Privacy   |    Cancellation & Refund Policy   |    Payment
Tel: +86-10-8572 5655 | Fax: +86-10-8581 9515 | Email: coc@codeofchina.com | QQ: 672269886
Copyright: Beijing COC Tech Co., Ltd. 2008-2040