![]() |
Chinese Standard Classification
Professional Classification
ICS Classification
Latest
|
| Position: Search | valid to be valid superseded to be superseded abolished to be abolished |
| Search |
|
GB/T 46223-2025 Microbeam analysis—Analytical electron microscopy—Method for the determination of energy resolution for electron energy loss spectrum analysis
Issued on: 2025-8-29 Price(USD): 570.0 |
|
JC/T 814-2024 Testing method of fusion-cast synthetic mica
Issued on: 2024-10-24 Price(USD): |
|
GB/T 43889-2024 Microbeam analysis—Electron probe microanalyser (EPMA)—Guidelines for performing quality assurance procedures
Issued on: 2024-4-25 Price(USD): 495.0 |
|
T/WHAS 066-2024 Determination of gestrinone - High-performance liquid chromatography
Issued on: 2024-10-15 Price(USD): |
|
T/WHAS 065-2024 Determination of ganaxolone - High-performance liquid chromatography
Issued on: 2024-10-15 Price(USD): |
|
GB/T 43748-2024 Microbeam analysis—Transmission electron microscopy—Method for measuring the thickness of functional thin films in integrated circuit chips
Issued on: 2024-3-15 Price(USD): 225.0 |
|
GB/T 44007-2024 Nanotechnologies—Measurement of the hydrogen storage capacity of nanoporous materials—Gas adsorption method
Issued on: 2024-4-25 Price(USD): 285.0 |
|
GB/T 43682-2024 Nanotechnology—Measurement methods for carrier mobility and sheet resistance of graphene films of sub-nanometer thickness
Issued on: 2024-3-15 Price(USD): 315.0 |
|
GB/T 43610-2023 Microbeam analysis—Analytical electron microscopy—Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
Issued on: 2023-12-28 Price(USD): 375.0 |
|
GB/T 43341-2023 Nanotechnology—Measurement of defect concentration of graphene—Raman spectroscopy method
Issued on: 2023-11-27 Price(USD): 465.0 |
|
GB/T 43087-2023 Microbeam analysis—Analytical electron microscopy—Method for the determination of interface position in the cross-sectional image of the layered materials
Issued on: 2023-09-07 Price(USD): 700.0 |
|
GB/T 43088-2023 Microbeam analysis—Analytical electron microscopy—Measurement of the dislocation density in thin metals
Issued on: 2023-09-07 Price(USD): 375.0 |
|
T/HNNMIA 63-2023
Issued on: 2023-12-29 Price(USD): |
|
GB/T 42310-2023 Nanotechnology—Measurement for specific surface area of graphene powder—Static volumetric method by argon gas adsorption
Issued on: 2023-03-17 Price(USD): 405.0 |
|
GB/T 42240-2022 Nanotechnology—Measurement of metallic impurities in graphene powder—Inductively coupled plasma mass spectrometry
Issued on: 2022-12-30 Price(USD): 360.0 |
|
GB/T 6488-2022 Single-mode optical fibres for telecommunication—Part 7: Characteristics of a bending loss insensitive single-mode optical fibre
Issued on: 2022-10-12 Price(USD): 120.0 |
|
GB/Z 41259-2022 Method for determination of quaternary ammonium compounds in preservative-treated wood and wood preservatives by potentiometric titrator
Issued on: 2022-4-15 Price(USD): 165.0 |
|
GB/T 24370-2021 Nanotechnologies—Characterization of cadmium chalcogenide colloidal quantum dot—UV-Vis absorption spectroscopy
Issued on: 2021-12-31 Price(USD): 315.0 |
|
GB/T 39560.702-2021 Determination of certain substances in electrical and electronic products—Part 7-2:Hexavalent chrome—Determination of hexavalent chrome[Cr(VI)]in polymers and electronics by the colormetric method
Issued on: 2021-10-11 Price(USD): 225.0 |
|
GB/T 39560.5-2021 Determination of certain substances in electrical and electronic products—Part 5: Cadmium, lead and chromium in polymers and electronics and cadmium and lead in metals by AAS, AFS, ICP-OES and ICP-MS
Issued on: 2021-10-11 Price(USD): 510.0 |
| Tel: +86-10-8572 5655 | Fax: +86-10-8581 9515 | Email: coc@codeofchina.com | QQ: 672269886 | ||
| Copyright: Beijing COC Tech Co., Ltd. 2008-2040 | ||