Code of China Chinese Standard Classification Professional Classification ICS Classification Latest
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GB/T 19922-2005 Standard test methods for measuring site flatness on silicon wafers by noncontact scanning 150.0 via email in 1~3 business day valid
GB/T 17473.2-1998 Test methods of precious metal pastes used for thick film microelectronics--Determination of fineness 60.0 via email in 1~3 business day abolished
GB/T 22638.1-2008 Test methods for aluminium and aluminium alloy foils - Part 1: Determination of thickness by gravimetric method 105.0 via email in 1~3 business day superseded
GB/T 22638.2-2016 Test methods for aluminium and aluminium alloy foils―Part 2:Determination of pinhole 90.0 via email in 1~3 business day valid
GB/T 22638.6-2016 Test methods for aluminium and aluminium alloy foils--Part 6: Determination of direct current resistance 160.0 via email in 1~3 business day valid
GB/T 22638.10-2008 Test methods for aluminium and aluminium alloy foils - Part 10: Determination of mass per unit area (surface density) of coatings 105.0 via email in 1~3 business day superseded
GB/T 22638.9-2008 Test methods for aluminium and aluminium alloy foils - Part 9: Determination of hydrophilic property 105.0 via email in 1~3 business day abolished
GB/T 22638.5-2008 Test methods for aluminium and aluminium alloy foils - Part 5: Determination of wettability by brushing 105.0 via email in 1~3 business day superseded
GB/T 18036-2000 The test method of thermo-emf for platinum rhodium thermocouple thin wires 165.0 via email in 1~3 business day abolished
GB/T 34487-2017 Shear testing method of aluminium alloy products for structural members 220.0 via email in 1~3 business day valid
GB/T 1553-1997 Standard test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconductivity decay 610.0 via email in 1~3 business day abolished
SN/T 1650-2005 Determination of iron aluminium calcium magnesium manganese zinc copper titanium chromium nickel vanadium in metal silicon - Inductively coupled plasma atomic emission spectrometry 105.0 via email in 1~3 business day valid
GB/T 17473.3-1998 Test methods of precious metal pastes used for thick film microelectronics--Determination of sheet resistance 90.0 via email in 1~3 business day superseded
GB/T 5252-2006 Germanium monocrystal - inspection of dislocation etch pit density 105.0 via email in 1~3 business day valid
GB/T 19921-2005 Test method of particles on silicon wafer surfaces 120.0 via email in 1~3 business day valid
GB/T 4326-2006 Extrinsic semiconductor single crystals measurement of Hall mobility and Hall coefficient 210.0 via email in 1~3 business day valid
GB/T 4059-2007 Polycrystalline silicon—Examination method—Zone-melting on phosphorus under controlled atmosphere 120.0 via email in 1~3 business day valid
GB/T 1979-2001 STANDARD diagrams for macrostructure and defect of structural steels 60.0 via email in 1 business day valid
GB/T 21546-2008 Critical current measurement - DC critical current of Nb-Ti composite superconductors 285.0 via email in 1~5 business day valid
GB/T 17473.7-1998 Test methods of precious metal pastes used for thick film microelectronics--Test of solderability and solderleaching resistance 75.0 via email in 1~3 business day superseded
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