Code of China Chinese Standard Classification Professional Classification ICS Classification Latest
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SJ/T 10897-1996 Determination of Co2O3 NiO and MnO2 in electronic glass - Atomic absorption method 30.0 via email in 1~3 business day valid
SJ 2003 7.2-1994 SJ 2003 7.2-1994 Detail specification for Type LGB2A0606 fixed inductors 105.0 via email in 1~3 business day valid
SJ/T 10755-1996 Test method for gold,silver and their alloy brazing for electronic devices-Test method for spittering 30.0 via email in 1~3 business day abolished
SJ 1.5-1987 Provision and requirements for preparation and revision of technical standards for electronic industry-Procedures for review of standards drafs by correspondence 75.0 via email in 1~3 business day valid
SJ 429-1973 Methods of measurement for frequency ranges of low noise travelling wave tubes 30.0 via email in 1~3 business day valid
SJ/T 10557.3-1994 Method for measurement of average dislocation density of Aluminium foil for electroytic capacitor 60.0 via email in 1~3 business day valid
SJ 362-73 Measurement conditions for reflex klystrons 60.0 via email in 1~3 business day valid
SJ/T 11025-1996 Analytical methods for silver copper brazing for electron device Determination of lead by atomic absorption spectrophotometry 100.0 via email in 1~3 business day abolished
SJ 984-75 Oscilloscope tubes,Type 13SJ38 150.0 via email in 1~3 business day valid
SJ/T 10859-1996 Test method for chromium film and photoresist thickness of chrome blanks 45.0 via email in 1~3 business day valid
SJ/T 10553-1994 Method of emission spectrochemical analysis of impurities in ZrO2 for use in electron ceramics 30.0 via email in 1~3 business day valid
SJ 1387-1978 Methods of measurement for filament current and filament voltage of noise-generator diodes 30.0 via email in 1~3 business day valid
SJ 2425-1983 Methods for tensile testing of fine metal wires 30.0 via email in 1~3 business day valid
SJ/T 10226-1991 Methods of determination for density of potassium silicate solution for use in electronic industry 45.0 via email in 1~3 business day valid
SJ/Z 1465-79 Method of chemical analysis of ceramic blank 660.0 via email in 1~3 business day valid
SJ/T 11023-1996 Methods of analysis for silver-copper brazing for electronic devices - Determination of bismuth (spectrophotometric-atomic absorption method) 45.0 via email in 1~3 business day valid
SJ/T 10224-1991 Graphic and Symbol base for electronic products CAD drawing standard architecture part graphic 270.0 via email in 1~3 business day abolished
SJ 1053-76 Reflex klystrons,Type K-27 180.0 via email in 1~3 business day valid
SJ/T 11126-1997 Encapsulation materials of phenolic series for use in electronic components 105.0 via email in 1~3 business day valid
SJ/T 10536.2-1994 Tungsten-Thorium alloy rod 60.0 via email in 1~3 business day valid
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