Code of China Chinese Standard Classification Professional Classification ICS Classification Latest
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GB/T 12962-2005 Monoccrystalline silicon 135.0 via email in 1~3 business day abolished
GB 12963-1991 60.0 via email in 1~3 business day superseded
YS/T 14-1991 45.0 via email in 1~3 business day superseded
GB/T 12963-2009 Specification for Polycrystalline Silicon 40.0 via email in 1 business day superseded
GB/T 14140-2009 Test method for measuring diameter of semiconductor wafer 180.0 via email in 1~3 business day valid
GB/T 35310-2017 200 mm silicon epitaxial wafer 165.0 via email in 1~3 business day to be valid
GB 12962-1991 105.0 via email in 1~3 business day superseded
GB/T 12965-2005 Monocrystalline silicon as cut slices and lapped slices 120.0 via email in 1~3 business day valid
GB/T 29851-2013 Test method for measuring boron and aluminium in silicon materials used for photovoltaic applications by secondary ion mass spectrometry 120.0 via email in business day valid
GB/T 12963-2014 Electronic-grade polycrystalline silicon 90.0 via email in 1~3 business day valid
SJ 20858-2002 Measuring methods for electrical parameters of silicon carbide single crystal material 135.0 via email in 1~3 business day valid
GB/T 6620-2009 Test method for measuring warp on silicon slices by noncontact scanning 180.0 via email in 1~3 business day valid
GB/T 12964-2003 Monocrystalline silicon polished wafers 150.0 via email in 1~3 business day valid
GB/T 29054-2012 Solar-grade casting multi-crystalline silicon brick 110.0 via email in 1~3 business day valid
GB/T 12962-1996 Monocrystalline silicon 120.0 via email in 1~3 business day superseded
GB 2881-1991 Technical requirements for silicon metal 45.0 via email in 1~3 business day superseded
GB/T 12964-1996 Monocrystalline silicon polished wafers 135.0 via email in 1~3 business day superseded
GB/T 29849-2013 Test method for measuring surface metallic contamination of silicon materials used for photovoltaic applications by inductively coupled plasma mass spectrometry 160.0 via email in business day valid
GB/T 32573-2016 Silicon powder―Determination of total carbon content―Infrared absorption method after combustion in an induction furnace 150.0 via email in 1~3 business day valid
GB/T 25074-2010 Solar-grade polycrystalline silicon 90.0 via email in 1~3 business day superseded
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