Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add to Cart |
SJ/T 11258-2001 |
Quartz crystal controlled oscillators of assessed quality - Part 5-1: Blank detail specification Qualification approval |
90.0 |
via email in 1~3 business day |
valid,,2002-5-1 |
|
YS/T 554-2006 |
Lithium niobate single crystals |
135.0 |
via email in 1~3 business day |
abolished2008-05-01,2008-5-1,2006-10-11 |
|
GB/T 12275-1990 |
The rule of type designation for quarz crystal oscillators |
45.0 |
via email in 1~3 business day |
valid,,1990-10-1 |
|
GB 5820.3-1986 |
Detail specification for electronic components--Bipolar transistors for ambient-rated low and high frequency amplification types 3DG201C |
450.0 |
via email in 1~3 business day |
superseded,,1986-9-1 |
|
GB/T 27700.2-2011 |
Surface acoustic wave(SAW) filters of assessed quality—Part 2:Guidance on use |
720.0 |
via email in 1~8 business day |
valid,,2012-5-1 |
|
GB/T 22318.1-2008 |
Surface acoustic wave(SAW)resonators - Part 1-1: General information and standard values |
210.0 |
via email in 1~3 business day |
valid,,2009-1-1 |
|
GB/T 15156-1994 |
Generic specification for piezoelectric ceramic transducing elements |
120.0 |
via email in 1~3 business day |
abolished2016-02-01,2016-2-1,1995-2-1 |
|
GB/T 11297.12-2012 |
Test method for extinction ratio of optical crystal |
110.0 |
via email in 1~3 business day |
valid,,2013-6-1 |
|
GB 8553-1987 |
Holders (Enclosures), crystal, general specification for |
150.0 |
via email in 1~3 business day |
valid,,1988-6-1 |
|
GB/T 12273.501-2012 |
Quartz crystal units A specification in the quality assessment system for electronic components Part 5.1: Blank detail specification- qualification approval |
170.0 |
via email in 1~3 business day |
valid,,2013-2-15 |
|
GB 12274-1990 |
Quartz orystal controlled oscillators-Generic specification |
90.0 |
via email in 1~3 business day |
superseded2013-02-15,2013-2-15,1990-10-1 |
|
QJ 2979-1997 |
Detailed Specifications of XJ 33 Quartz Crystal Component |
135.0 |
via email in 1~3 business day |
valid,,1997-10-17 |
|
GB/T 12859.201-2012 |
Piezoelectric ceramic resonators - A specification in the quality assessment System for electronic components - Part 2-1: Blank detail specification-Assessment level E |
140.0 |
via email in 1~3 business day |
valid,,2013-2-15 |
|
SJ/T 11212-1999 |
Measurement of quartz crystal unit parameters Part 6: Measurement of drive level dependence (DLD) |
174.0 |
via email in 1~3 business day |
valid,,1999-12-1 |
|
YS/T 42-1992 |
|
|
via email in business day |
superseded2011-03-01,2011-3-1,1991-6-1 |
|
GB/T 16517-1996 |
Quartz crystal units-A specification in the Quality Assessment System for Electronic Components Part 3: Sectional specification - Qualification approval |
150.0 |
via email in 1~3 business day |
valid,,1997-5-1 |
|
GB 9532-1988 |
Designations for LiNbO3,LiTaO3,Bi12GeO20,Bi12SiO20 piezoelectric crystals |
30.0 |
via email in 1~3 business day |
superseded2013-02-15,2013-2-15,1989-2-1 |
|
JC/T 2132-2012 |
Determination of doped and trace elements in barium strontium titanate(BST)—Inductively coupled plasma atomic emission spectrometric method |
120.0 |
via email in 1~3 business day |
valid,,2013-6-1 |
|
SJ/T 11256-2001 |
Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification |
770.0 |
via email in 1~3 business day |
abolished2017-05-12,,2002-5-1 |
|
SJ/T 11211-1999 |
Measurement of quartz crystal unit parameters Part 5: Method for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction |
540.0 |
via email in 1~8 business day |
valid,,1999-12-1 |
|
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