Code of China Chinese Standard Classification Professional Classification ICS Classification Latest
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SJ 2658.7-1986 Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Radiant Flux 60.0 via email in 1~3 business day abolished
SJ 2658.12-1986 Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Peak Emission Wavelength and Spectral Half Width 75.0 via email in 1~3 business day superseded
SJ 2658.4-1986 Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Capacitance 60.0 via email in 1~3 business day superseded
SJ 2658.13-1986 Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Output Optical Power Temperature Coefficient 75.0 via email in 1~3 business day to be abolished
SJ 2658.3-1986 Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Backward Voltage 60.0 via email in 1~3 business day abolished
SJ 53930/1-2002 Semiconductor optoelectronic devices detail specification for type GR8813 infrared emitting diode 120.0 via email in 1~3 business day valid
SJ 2658.5-1986 Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Forward Series Resistance 60.0 via email in 1~3 business day superseded
SJ 2658.1-1986 Methods of Measurement for Semiconductor Infrared Diodes - General Rules 30.0 via email in 1~3 business day superseded
SJ 2658.10-1986 Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Modulated Wideband 75.0 via email in 1~3 business day superseded
SJ 2658.8-1986 Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Normal Radiance 75.0 via email in 1~3 business day superseded
SJ 2658.9-1986 Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for the Intensity Space Distribution and Half-intensity Angle of Radiation 75.0 via email in 1~3 business day superseded
SJ 2658.2-1986 Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Forward Voltage Drop 60.0 via email in 1~3 business day superseded
SJ 2658.6-1986 Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Output Optical Power 75.0 via email in 1~3 business day valid
JB/T 10875-2008 Measuring methods for optical proerties of LEDs 180.0 via email in 1~3 business day valid
SJ 2658.11-1986 Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Pulse Response Characteristics 75.0 via email in 1~3 business day superseded
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