Code of China Chinese Standard Classification Professional Classification ICS Classification Latest
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JB/T 6842-1993 Test Method of Scanning Electron Microscope 150.0 via email in 1~3 business day valid
GB/T 15245-2002 Quantitative analysis of rare earth element(REE) oxides by electron probe microanalysis(EPMA) 120.0 via email in 1~3 business day valid
JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution 60.0 via email in 1~3 business day valid
GB/T 18873-2002 General specification of transmission electron microscope(TEM)-X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens 105.0 via email in 1~3 business day abolished
JB/T 5521-1991 Optical Transfer Function for Microscope via email in business day valid
JY/T 001-1996 General rules for fourier transform infrared spectrometer 375.0 via email in 1~5 business day valid
GB/T 15247-2008 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using calibration curve method 230.0 via email in 1~3 business day valid
GB/T 18735-2002 General specification of nanometer thin STANDARD specimen for analytical transmission electron microscopy (AEM/EDS) 75.0 via email in 1~3 business day superseded
GB/T 23414-2009 Microbeam analysis - Scanning electron microscopy - Vocabulary 465.0 via email in 1~5 business day valid
JY/T 011-1996 General rules for transmission electron microscopy 135.0 via email in 1~3 business day valid
GB 7247.1-2001 Safety of laser products--Part 1:Equipment classification,requirements and users guide 810.0 via email in 1~3 business day abolished
JB/T 9324-1999 Visible spectrophotometer 120.0 via email in 1~3 business day valid
JB/T 5522-1991 Optical Transfer Function Application - 35 mm Camera Interchangeable Lens 60.0 via email in 1~3 business day valid
JY/T 012-1996 General rules for metallographic microscopy 75.0 via email in 1~3 business day valid
JB/T 5383-1991 Specification for Transmission Electron Microscope 90.0 via email in 1~3 business day valid
JB/T 6177-1992 Melting Point Determination Apparatus 90.0 via email in 1~3 business day valid
GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors 120.0 via email in 1~3 business day superseded
GB/T 20176-2006 Surface chemical analysis-Secondary-ion mass spectrometry-Determination of boron atomic concentration in silicon using uniformly doped materials 230.0 via email in 1~3 business day valid
JB/T 8239.2-1999 Specification for diffraction grating 90.0 via email in 1~3 business day valid
JB/T 5480-1991 Diaphragm of Electron Microscope 90.0 via email in 1~3 business day valid
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