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| Standard Insuued on: 2012-11 |
GB/T 4937.4-2012 Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
半导体器件 机械和气候试验方法 第4部分：强加速稳态湿热试验（HAST）
| Category No.: | GB | Valid Status: | valid |
| Issued Organization: | AQSIQ;SAC | Issued Date: | 2012-11-5 |
| Implemented Date: | 2013-2-15 | Abolished Date: | |
| Superseded Standard.: | Superseded Date: |
DB62/T 2296-2012
DB21/T 2028.2-2012
DB21/T 2038-2012
DB21/T 2034-2012
DB34/T 1716-2012
DB21/T 2031-2012
DB12/T 246-2012
DB34/T 1733.3-2012
DB21/T 2021-2012
DB22/T 1593-2012
DB34/T 1717-2012
DB22/T 1592-2012
DB62/T 2295-2012
农业部1861号公告-3-2012
DB51/T 1487-2012
DB45/T 853-2012
DB21/T 2035-2012
DB51/T 1491-2012
DB51/T 1481-2012
DB21/T 2028.3-2012
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