2024-12-22 3.129.253.238
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Code of China
Chinese National Standard List: Electron optics and other physical optics instrument

GB 10984-1989 Monochromator 
  Issued on:   Price(USD): 260.0
GB/T 43883-2024 Microbeam analysis—Analytical electron microscopy—Method for determining the number density of nanoparticles in a metal 
  Issued on: 2024-4-25   Price(USD): 480.0
GB/T 43748-2024 Microbeam analysis—Transmission electron microscopy—Method for measuring the thickness of functional thin films in integrated circuit chips 
  Issued on: 2024-3-15   Price(USD): 225.0
GB/T 43610-2023 Microbeam analysis—Analytical electron microscopy—Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy 
  Issued on: 2023-12-28   Price(USD): 375.0
GB/T 43087-2023 Microbeam analysis—Analytical electron microscopy—Method for the determination of interface position in the cross-sectional image of the layered materials  
  Issued on: 2023-09-07   Price(USD): 700.0
GB/T 42208-2022 Nanotechnologies—Measurement of nanoparticle size in multiphase system—Image method of transmission electron microsopy 
  Issued on: 2022-12-30   Price(USD): 255.0
GB/T 15246-2022 Microbeam analysis—Quantitative analysis of sulfide minerals by electron probe microanalysis 
  Issued on: 2022-10-12   Price(USD): 210.0
GB/T 34831-2017 Nanotechnologies-Electron microscopy imaging of noble metal nanoparticles- High angle annular dark field imaging method 
  Issued on: 2017-11-01   Price(USD): 220.0
GB/T 30543-2014 Nanotechnologies - Characterization of Single-Wall Carbon Nanotubes Using Transmission Electron Microscopy 
  Issued on: 2014-5-6   Price(USD): 540.0
JB/T 11144-2011 X-ray diffractometer 
  Issued on: 2011-12-20   Price(USD): 120.0
JB/T 11145-2011 X-ray fluorescence spectrometer 
  Issued on: 2011-12-20   Price(USD): 120.0
GB/T 26533-2011 General rules for Auger electron spectroscopic analysis 
  Issued on: 2011-5-12   Price(USD): 210.0
JB/T 9400-2010 Specification of X-ray diffractometer 
  Issued on: 2010-2-11   Price(USD): 130.0
GB/T 23414-2009 Microbeam analysis - Scanning electron microscopy - Vocabulary 
  Issued on: 2009-04-01   Price(USD): 450.0
GB/T 18151-2008 Laser guards 
  Issued on: 2000-07-24   Price(USD): 780.0
GB/T 15247-2008 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using calibration curve method 
  Issued on: 2008-08-20   Price(USD): 220.0
GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors 
  Issued on: 2006-12-25   Price(USD): 120.0
GB/T 20307-2006 General rules for nanometer-scale lengthmeasurement by SEM 
  Issued on: 2006-07-19   Price(USD): 180.0
GB/T 20176-2006 Surface chemical analysis-Secondary-ion mass spectrometry-Determination of boron atomic concentration in silicon using uniformly doped materials 
  Issued on: 2006-03-27   Price(USD): 220.0
GB/T 20175-2006 Surface chemical analysis-Sputter depth profiling-Optimization using layered systems as reference materials 
  Issued on: 2006-03-27   Price(USD): 190.0
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