2023-9-22 3.239.59.31
Code of China Chinese Classification Professional Classification ICS Classification Latest Value-added Services

Code of China
Chinese National Standard List: Electron optics and other physical optics instrument

GB/T 42208-2022 Nanotechnologies—Measurement of nanoparticle size in multiphase system—Image method of transmission electron microsopy 
  Issued on: 2022-12-30   Price(USD): 255.0
GB/T 34831-2017 Nanotechnologies-Electron microscopy imaging of noble metal nanoparticles- High angle annular dark field imaging method 
  Issued on: 2017-11-01   Price(USD): 220.0
GB/T 30543-2014 Nanotechnologies - Characterization of Single-Wall Carbon Nanotubes Using Transmission Electron Microscopy 
  Issued on: 2014-5-6   Price(USD): 540.0
JB/T 11144-2011 X-ray diffractometer 
  Issued on: 2011-12-20   Price(USD): 120.0
JB/T 11145-2011 X-ray fluorescence spectrometer 
  Issued on: 2011-12-20   Price(USD): 120.0
GB/T 26533-2011 General rules for Auger electron spectroscopic analysis 
  Issued on: 2011-5-12   Price(USD): 210.0
JB/T 9400-2010 Specification of X-ray diffractometer 
  Issued on: 2010-2-11   Price(USD): 130.0
GB/T 23414-2009 Microbeam analysis - Scanning electron microscopy - Vocabulary 
  Issued on: 2009-04-01   Price(USD): 450.0
GB/T 18151-2008 Laser guards 
  Issued on: 2000-07-24   Price(USD): 780.0
GB/T 15247-2008 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using calibration curve method 
  Issued on: 2008-08-20   Price(USD): 220.0
GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors 
  Issued on: 2006-12-25   Price(USD): 120.0
GB/T 20307-2006 General rules for nanometer-scale lengthmeasurement by SEM 
  Issued on: 2006-07-19   Price(USD): 180.0
GB/T 20176-2006 Surface chemical analysis-Secondary-ion mass spectrometry-Determination of boron atomic concentration in silicon using uniformly doped materials 
  Issued on: 2006-03-27   Price(USD): 220.0
GB/T 20175-2006 Surface chemical analysis-Sputter depth profiling-Optimization using layered systems as reference materials 
  Issued on: 2006-03-27   Price(USD): 190.0
JB/T 10573-2006 Toolmakers microscope 
  Issued on: 2006-7-27   Price(USD): 270.0
GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method 
  Issued on: 2004-4-30   Price(USD): 224.0
JB/T 5482-2004 The specification for X-ray Crystal Orientation apparatus 
  Issued on: 2004-06-17   Price(USD): 304.0
GB 7667-2003 The dose of X-rays leakage from electron microscope 
  Issued on: 2003-10-10   Price(USD): 30.0
GB/T 15245-2002 Quantitative analysis of rare earth element(REE) oxides by electron probe microanalysis(EPMA) 
  Issued on: 2002-11-11   Price(USD): 120.0
GB/T 18873-2002 General specification of transmission electron microscope(TEM)-X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens 
  Issued on: 2002-11-11   Price(USD): 100.0
About Us   |    Contact Us   |    Terms of Service   |    Privacy   |    Cancellation & Refund Policy   |    Payment
Tel: +86-10-8572 5655 | Fax: +86-10-8581 9515 Email: coc@codeofchina.com | Send me a messageQQ: 672269886
Copyright: TransForyou Co., Ltd. 2008-2040