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| Position: Chinese Standard in English/GB/T 26068-2010 |
| GB/T 26068-2010 Test method for carrier recombination lifetime in silicon wafers by non-contact measurement of photoconductivity decay by microwave reflectance (English Version) | |||
| Standard No.: | GB/T 26068-2010 | Status: | superseded |
| Language: | English | File Format: | |
| Word Count: | 13000 words | Price(USD): | 390.00 remind me the price change |
| Implemented on: | 2011-10-1 | Delivery: | via email in 1~3 business day |
| Standard No.: | GB/T 26068-2010 |
| English Name: | Test method for carrier recombination lifetime in silicon wafers by non-contact measurement of photoconductivity decay by microwave reflectance |
| Chinese Name: | 硅片载流子复合寿命的无接触微波反射光电导衰减测试方法 |
| Chinese Classification: | H80 Semimetal and semiconductor material in general |
| Professional Classification: | GB National Standard |
| ICS Classification: | 29.045 Semiconducting materials |
| Issued by: | AQSIQ |
| Issued on: | 2011-1-10 |
| Implemented on: | 2011-10-1 |
| Status: | superseded |
| Superseded by: | GB/T 26068-2018 Test method for carrier recombination lifetime in silicon wafers and silicon ingots—Non-contact measurement of photoconductivity decay by microwave reflectance method |
| Superseded on: | 2019-11-1 |
| Language: | English |
| File Format: | |
| Word Count: | 13000 words |
| Price(USD): | 390.00 |
| Delivery: | via email in 1~3 business day |