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Code of China
Chinese National Standard List: Basic standards and general methods

GB/T 41073-2021 Surface chemical analysis―Electron spectroscopies―Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy 
  Issued on: 2021-12-31   Translation Price(USD): 315.0
GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films  
  Issued on: 2021-12-31   Translation Price(USD): 270.0
GB/T 41072-2021 Surface chemical analysis - Electron spectroscopies - Guidelines for ultraviolet photoelectron spectroscopy analysis 
  Issued on: 2021-12-31   Translation Price(USD): 315.0
GB/T 40300-2021 Microbeam analysis—Analytical electron microscopy—Vocabulary 
  Issued on: 2021-08-20   Translation Price(USD): 495.0
GB/T 40110-2021 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy 
  Issued on: 2021-05-21   Translation Price(USD): 450.0
GB/T 40109-2021 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon 
  Issued on: 2021-05-21   Translation Price(USD): 250.0
GB/T 40244-2021 Chemicals - Liquid or solid identification - Fluidity test method 
  Issued on: 2021-05-21   Translation Price(USD): 100.0
GB/T 4930-2021 Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials (CRMs)  
  Issued on: 2021-05-21   Translation Price(USD): 255.0
GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer 
  Issued on: 2021-05-21   Translation Price(USD): 255.0
GB/T 40128-2021 Surface chemical analysis—Atomic force microscopy—Test method for thickness of the two-dimensional layered molybdenum disulfide nanosheets 
  Issued on: 2021-05-21   Translation Price(USD): 315.0
T/ICMTIA 1-2019 The Integrated Circuit Materials Industry Technology Innovative Alliance—Gas base specification 
  Issued on: 2019-04-17   Translation Price(USD):
GB/T 36533-2018 Determination of the chemical state of micro-iron in silicate—Auger electron spectroscopy 
  Issued on: 2018-07-13   Translation Price(USD): 220.0
GB/T 36504-2018 Guide for the analysis of the printed circuit board surface contamination—Auger electron spectroscopy 
  Issued on: 2018-07-13   Translation Price(USD): 160.0
GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis 
  Issued on: 2018-06-07   Translation Price(USD): 610.0
GB/T 35099-2018 Microbeam analysis—Scanning electron microscopy with energy dispersive X-ray spectrometry—Morphology and element analysis of single fine particles in ambient air 
  Issued on: 2018-05-14   Translation Price(USD): 250.0
GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant virusesby transmission electron microscopy 
  Issued on: 2018-05-14   Translation Price(USD): 250.0
GB/T 35097-2018 Microbeam analysis—Scanning electron microscopy with energy dispersive X-ray spectrosmetry—Determination of numberical concentration of inorganic fibrous particles in ambient air 
  Issued on: 2018-05-14   Translation Price(USD): 370.0
GB/T 36053-2018 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry—Instrumental requirements, alignment and positioning, data collection, data analysis and reporting 
  Issued on: 2018-03-15   Translation Price(USD): 430.0
GB/T 36052-2018 Surface chemical analysis—Data transfer format for scanning probe microscopy 
  Issued on: 2019-02-01   Translation Price(USD): 490.0
GB/T 35158-2017 Verification method for Auger electron spectrometers 
  Issued on: 2017-12-29   Translation Price(USD): 810.0
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