2025-12-29 10.8.118.215
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Chinese National Standard List: Metal physical property test method

GB/T 32188-2015 The method for full width at half maximum of double crystal X-ray rocking curve of GaN single crystal substrate 
  Issued on: 2015-12-10   Translation Price(USD): 140.0
GB/T 31780-2015 Critical temperature measurement―Critical temperature of composite superconductors by a resistance method 
  Issued on: 2015-07-03   Translation Price(USD): 160.0
GB/T 31475-2015 Requirements for solder paste for high-quality interconnections in electronics assembly 
  Issued on: 2015-05-15   Translation Price(USD): 250.0
GB/T 31474-2015 Soldering fluxes for high-quality interconnections in electronics assembly 
  Issued on: 2015-05-15   Translation Price(USD): 310.0
YS/T 1065.1-2015 Methods for physical performance determination of zeolite―Part 1:Determination of calcium binding capacity―EDTA titrimetric method 
  Issued on: 2015-04-30   Translation Price(USD): 105.0
YS/T 15-2015 Test method for thickness of epitaxial layers and diffused layers by angle lap stain 
  Issued on: 2015-04-30   Translation Price(USD): 105.0
YS/T 1065.4-2015 Methods for physical performance determination of zeolite―Part 4:Determination of non-ionic liquid-carrying capacity 
  Issued on: 2015-04-30   Translation Price(USD): 80.0
YS/T 1065.2-2015 Methods for physical performance determination of zeolite―Part 2:Determination of particle size―Centrifugal sedimentation method 
  Issued on: 2015-04-30   Translation Price(USD): 80.0
GB/T 30653-2014 Test method for crystal quality of Ⅲ-nitride epitaxial layers 
  Issued on: 2014-12-31   Translation Price(USD): 150.0
GB/T 30654-2014 Test method for lattice constant of Ⅲ-nitride epitaxial layers 
  Issued on: 2014-12-31   Translation Price(USD): 150.0
GB/T 31353-2014 Test methods for bow of sapphire substrates 
  Issued on: 2014-12-31   Translation Price(USD): 150.0
GB/T 31352-2014 Test methods for warp of sapphire substrates 
  Issued on: 2014-12-31   Translation Price(USD): 150.0
GB/T 30655-2014 Test methods for internal quantum efficiency of nitride LED epitaxial layers 
  Issued on: 2014-12-31   Translation Price(USD): 150.0
GB/T 30857-2014 Standard test method for thickness and thickness variation on sapphire substrates 
  Issued on: 2014-07-24   Translation Price(USD): 100.0
YS/T 1002-2014 Calculation method of anode effect frequency and anode effect duration for aluminum electrolysis 
  Issued on: 2014-10-14   Translation Price(USD): 105.0
GB/T 30859-2014 Test method for warp and waviness of silicon wafers for solar cells 
  Issued on: 2014-07-24   Translation Price(USD): 180.0
GB/T 30860-2014 Test methods for surface roughness and saw mark of silicon wafers for solar cells 
  Issued on: 2014-07-24   Translation Price(USD): 180.0
GB/T 30869-2014 Test method for thickness and total thickness variation of silicon wafers for solar cell 
  Issued on: 2014-07-24   Translation Price(USD): 150.0
GB/T 30537-2014 Superconductivity - Measurements for Bulk High Temperature Superconductors - Trapped Flux Density of Large Grain Oxide Superconductors 
  Issued on: 2014-5-6   Translation Price(USD): 300.0
DB44/T 1328-2014 Testing technical specification for patterned sapphire substrate 
  Issued on: 2014-04-18   Translation Price(USD):
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