| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add to Cart |
| SJ 1523-1979 |
|
$180.00 |
via email in 1~3 business day |
superseded,1994-10-1,1994-10-1 |
|
| SJ 1524-1979 |
|
$180.00 |
via email in business day |
superseded,1994-10-1, |
|
| SJ 1525-1979 |
|
$180.00 |
via email in 1~3 business day |
superseded,1994-10-1,1994-10-1 |
|
| SJ 1531-1979 |
Contact diameter series for leading ring of ceramic-metal electronic tubes |
$60.00 |
via email in 1~3 business day |
valid,,1979-12-1 |
|
| SJ 1532-1979 |
~ |
$255.00 |
via email in 1~3 business day |
valid,,1979-12-1 |
|
| SJ 1533-1979 |
Transmitting tubes,Type FU-433S |
$120.00 |
via email in 1~3 business day |
valid,,1979-12-1 |
|
| SJ 1538-1987 |
Compositions of Nickel and Nickel alloy for vacuum tubes |
$30.00 |
via email in 1~3 business day |
valid,,1987-12-1 |
|
| SJ 1539-1987 |
Nickel and Nickel alloy bars for vacuum tubes |
$240.00 |
via email in 1~3 business day |
valid,,1987-12-1 |
|
| SJ 1540-1987 |
Nickel and Nickel alloy wires for use in vacuum devices |
$184.00 |
via email in 1~3 business day |
valid,,1987-12-1 |
|
| SJ 1541-1987 |
Nickel and Nickel alloy strips for vacuum tubes |
$184.00 |
via email in 1~3 business day |
abolished2024-07-11,,1987-12-1 |
|
| SJ 1542-1987 |
Method for chemical analysis of Nickel and Nickel alloy for vacuum tubes |
$210.00 |
via email in 1~3 business day |
valid,,1987-12-1 |
|
| SJ 1543-1988 |
Method for spectral analysis of Nickel and Nickel aloy for vacuum tubes |
$244.00 |
via email in 1~3 business day |
superseded,2021-4-1,1987-12-1 |
|
| SJ 1545-1979 |
Pulsed magnetrons,Type CKM-120 |
$135.00 |
via email in 1~3 business day |
valid,,1980-6-1 |
|
| SJ 1546-1979 |
Continuous wave magnetrons,Type CK-140B |
$90.00 |
via email in 1~3 business day |
valid,,1980-6-1 |
|
| SJ 1547-1979 |
Continuous wave magnetrons,Type CK-141 |
$75.00 |
via email in 1~3 business day |
valid,,1980-6-1 |
|
| SJ 1549-1979 |
Silicon epitaxial wafers (Provisional) |
$90.00 |
via email in 1~3 business day |
valid,,1980-6-1 |
|
| SJ 1550-1979 |
Method of inspection for silicon epitaxial wafers |
$340.00 |
via email in 1~3 business day |
valid,, |
|
| SJ 1551-1979 |
Method of measurement for resistivity of silicon epitaxial layer (capacitance-voltage method) (Provisional) |
$184.00 |
via email in 1~3 business day |
abolished2010-02-01 ,,1980-6-1 |
|
| SJ 1552-1979 |
Performance requirements for assembling of special equipment for electronic industry (Provisional) |
$90.00 |
via email in 1~3 business day |
valid,,1980-6-1 |
|
| SJ 1553-1980 |
General specification for negative temperature coefficient thermistors for temperature measurement |
$544.00 |
via email in 1~3 business day |
superseded,1987-8-1,1980-10-1 |
|
* Related standard quantity: * Page quantity: *
Current: * First
Previous
[7][8][9][10][11][12][13][14][15][16][17]
Next
End
* Related standard quantity: * Page quantity: *
Current: * First
Previous
[7][8][9][10][11][12][13][14][15][16][17]
Next
End
|
