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| Position: Chinese Standard in English/SJ 1550-1979 |
| SJ 1550-1979 Method of inspection for silicon epitaxial wafers (English Version) | |||
| Standard No.: | SJ 1550-1979 | Status: | valid remind me the status change |
| Language: | English | File Format: | |
| Word Count: | 6000 words | Price(USD): | 340.00 remind me the price change |
| Implemented on: | Delivery: | via email in 1~3 business day | |
| Standard No.: | SJ 1550-1979 |
| English Name: | Method of inspection for silicon epitaxial wafers |
| Chinese Name: | 硅外延片检测方法 |
| Professional Classification: | SJ Professional Standard - Electronics |
| Status: | valid |
| Language: | English |
| File Format: | |
| Word Count: | 6000 words |
| Price(USD): | 340.00 |
| Delivery: | via email in 1~3 business day |